OPA2277-DIE Datasheet, PDF (1/4 Pages) Texas Instruments – HIGH-PRECISION OPERATIONAL AMPLIFIER

OPA2277-DIE
www.ti.com
SBOS611 – MARCH 2012
HIGH-PRECISION OPERATIONAL AMPLIFIER
Check for Samples: OPA2277-DIE
FEATURES
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• Ultra Low Offset Voltage
• Ultra Low Drift
• High Open-Loop Gain
• High Common-Mode Rejection
• High Power Supply Rejection
• Low Bias Current
• Wide Supply Range: ±2V to ±18V
• Low Quiescent Current
APPLICATIONS
• Transducer Amplifier
• Bridge Amplifier
• Temperature Measurements
• Strain Gage Amplifier
• Precision Integrator
• Battery Powered Instruments
• Test Equipment
DESCRIPTION
The OPA2277 precision op amp replaces the industry standard OP-177. It offers improved noise, wider output
voltage swing, and are twice as fast with half the quiescent current. Features include ultra low offset voltage and
drift, low bias current, high common-mode rejection, and high power supply rejection.
The OPA2277 op amp operates from ±2V to ±18V supplies with excellent performance. Unlike most op amps
which are specified at only one supply voltage, the OPA2277 is specified for real-world applications; a single limit
applies over the ±5V to ±15V supply range. High performance is maintained as the amplifiers swing to their
specified limits.
The OPA2277 op amp is easy to use and free from phase inversion and overload problems found in some other
op amps. It is stable in unity gain and provides excellent dynamic behavior over a wide range of load conditions.
The dual version features completely independent circuitry for lowest crosstalk and freedom from interaction,
even when overdriven or overloaded.
PRODUCT
OPA2277
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER
Bare Die In Waffle
Pack ⁽²⁾
OPA2277TDD1
OPA2277TDD2
PACKAGE QUANTITY
252
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(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated