MSP430F417-DIE Datasheet, PDF (1/6 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER

MSP430F417-DIE
www.ti.com
MIXED SIGNAL MICROCONTROLLER
SLAS891 – JULY 2012
FEATURES
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• Low Supply-Voltage Range, 1.8 V to 3.6 V
• Ultralow Power Consumption
• Five Power-Saving Modes
• Wake-Up From Standby Mode
• Frequency-Locked Loop (FLL+)
• 16-Bit RISC Architecture
• 16-Bit Timer_A With Three or Five
Capture/Compare Registers
• Integrated LCD Driver for 96 Segments
• On-Chip Comparator
• Brownout Detector
• Supply Voltage Supervisor/Monitor −
Programmable Level Detection
• Serial Onboard Programming, No External
Programming Voltage Needed, Programmable
Code Protection by Security Fuse
• Bootstrap Loader in Flash Devices
DESCRIPTION
The Texas Instruments MSP430 family of ultra-low-power microcontrollers consists of several devices featuring
different sets of peripherals targeted for various applications. The architecture, combined with five low power
modes, is optimized to achieve extended battery life in portable measurement applications. The device features a
powerful 16-bit RISC CPU, 16-bit registers, and constant generators that contribute to maximum code efficiency.
The digitally controlled oscillator (DCO) allows wake-up from low-power modes to active mode in less than 6 μs.
The MSP430F417 is a microcontroller configuration with one or two built-in 16-bit timers, a comparator, 96 LCD
segment drive capability, and 48 I/O pins.
Typical applications include sensor systems that capture analog signals, convert them to digital values, and
process the data and transmit them to a host system. The comparator and timer make the configurations ideal
for industrial meters, counter applications and handheld meters.
PRODUCT
MSP430F417
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER
Bare die in waffle pack⁽²⁾
MSP430F417TDE1
MSP430F417TDE2
PACKAGE QUANTITY
100
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated