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LMC6772AIMMX_NOPB Datasheet, PDF (1/25 Pages) Texas Instruments – Dual Micropower Rail-To-Rail Input CMOS Comparator with Open Drain Output
LMC6772
www.ti.com
SNOS749F – SEPTEMBER 1995 – REVISED MARCH 2013
Dual Micropower Rail-To-Rail Input CMOS Comparator with Open Drain Output
Check for Samples: LMC6772
FEATURES
1
2(Typical Unless Otherwise Noted)
• Low Power Consumption (Max): IS = 10
μA/comp
• Wide Range of Supply Voltages: 2.7V to 15V
• Rail-to-Rail Input Common Mode Voltage
Range
• Open Drain Output
• Short Circuit Protection: 40 mA
• Propagation Delay (@VS = 5V, 100 mV
Overdrive): 5 μs
• LMC6772Q is AEC-Q Qualified
• LMC6772Q has −40°C to 125°C Temperature
Range
APPLICATIONS
• Laptop Computers
• Mobile Phones
• Metering Systems
• Hand-Held Electronics
• RC Timers
• Alarm and Monitoring Circuits
• Window Comparators, Multivibrators
DESCRIPTION
The LMC6772 is an ultra low power dual comparator
with a maximum 10 μA/comparator power supply
current. It is designed to operate over a wide range of
supply voltages, with a minimum supply voltage of
2.7V.
The common mode voltage range of the LMC6772
exceeds both the positive and negative supply rails, a
significant advantage in single supply applications.
The open drain output of the LMC6772 allows for
wired-OR configurations. The open drain output also
offers the advantage of allowing the output to be
pulled to any voltage rail up to 15V, regardless of the
supply voltage of the LMC6772.
The LMC6772 is targeted for systems where low
power consumption is the critical parameter. Ensured
operation at supply voltages of 2.7V and rail-to-rail
performance makes this comparator ideal for battery-
powered applications.
Refer to the LMC6762 datasheet for a push-pull
output stage version of this device.
Connection Diagram
8-Pin PDIP/SOIC/VSSOP - Top View
See Package Number P0008E/D0008A/DGK0008A
1
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1995–2013, Texas Instruments Incorporated