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DS89C386_16 Datasheet, PDF (1/13 Pages) Texas Instruments – Twelve Channel CMOS Differential Line Receiver
DS89C386
www.ti.com
SNLS100C – MAY 1995 – REVISED APRIL 2013
DS89C386 Twelve Channel CMOS Differential Line Receiver
Check for Samples: DS89C386
FEATURES
1
•2 Low Power Design—240 mW Typical
• Meets TIA/EIA-422-B (RS-422)
• Receiver OPEN Input Failsafe Feature
• Ensured AC Parameters:
– Maximum Receiver Skew −4 ns
– Maximum Transition Time −9 ns
• High Output Drive Capability: ±6 mA
• Available in SSOP Packaging:
– Requires 30% less PCB Space than 3
DS34C86TMs
DESCRIPTION
The DS89C386 is a high speed twelve channel
CMOS differential receiver that meets the
requirements of TIA/EIA-422-B. The DS89C386
features low power dissipation of 240 mW typical.
Each TRI-STATE enable, EN, allows the receiver
output to be active or in a Hi-impedance off state.
Each enable is common to only two receivers for
flexibility and multiplexing of receiver outputs.
The receiver output (RO) is ensured to be High when
the inputs are left open and unterminated. The
receiver can detect signals as low and including ±200
mV over the common mode range of ±7V. The
receiver outputs (RO) are compatible with both TTL
and CMOS levels.
Connection Diagrams
1/6 of package
Figure 2. Function Diagram
Enable
EN
L
H
H
H
Truth Table (1)
Inputs
RI–RI*
X
≥200 mV or OPEN (1)
≤ −200 mV
+200 mV > and > −200 mV
Output
RO
Z
H
L
X
Figure 1. 48-Pin SSOP
See Package Number DL0048A
(1) Not terminated.
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1995–2013, Texas Instruments Incorporated