English
Language : 

DS36C200_13 Datasheet, PDF (1/16 Pages) Texas Instruments – DS36C200 Dual High Speed Bi-Directional Differential Transceiver
DS36C200
www.ti.com
SNLS111D – JUNE 1998 – REVISED APRIL 2013
DS36C200 Dual High Speed Bi-Directional Differential Transceiver
Check for Samples: DS36C200
FEATURES
1
•2 Optimized for DSS to DVHS Interface Link
• Compatible IEEE 1394 Signaling Voltage
Levels
• Operates Above 100 Mbps
• Bi-directional Transceivers
• 14-lead SOIC Package
• Ultra Low Power Dissipation
• ±100 mV Receiver Sensitivity
• Low Differential Output Swing Typical 210 mV
• High Impedance During Power Off
DESCRIPTION
The DS36C200 is a dual transceiver device optimized
for high data rate and low power applications. This
device provides a single chip solution for a dual high
speed bi-directional interface. Also, both control pins
may be routed together for single bit control of
datastreams. Both control pins are adjacent to each
other for ease of routing them together. The
DS36C200 is compatible with IEEE 1394 physical
layer and may be used as an economical solution
with some considerations. Please reference the
application information on 1394 for more information.
The device is in a 14-lead small outline package. The
differential driver outputs provides low EMI with its
low output swings typically 210 mV. The receiver
offers ±100 mV threshold sensitivity, in addition to
common-mode noise protection.
Connection Diagram
Note: * denotes active LOW pin
Figure 1. SOIC Package
See Package Number D (R-PDSO-G14)
Functional Diagram
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1998–2013, Texas Instruments Incorporated