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CDCP1803_13 Datasheet, PDF (1/25 Pages) Texas Instruments – 1:3 LVPECL CLOCK BUFFER
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CDCP1803
SCAS727F – NOVEMBER 2003 – REVISED DECEMBER 2013
1:3 LVPECL CLOCK BUFFER
WITH PROGRAMMABLE DIVIDER
Check for Samples: CDCP1803
FEATURES
1
• Distributes One Differential Clock Input to
Three LVPECL Differential Clock Outputs
• Programmable Output Divider for Two LVPECL
Outputs
• Low-Output Skew 15 ps (Typical)
• VCC Range 3 V–3.6 V
• Signaling Rate Up to 800-MHz LVPECL
• Differential Input Stage for Wide Common-
Mode Range
• Provides VBB Bias Voltage Output for Single-
Ended Input Signals
• Receiver Input Threshold ±75 mV
• 24-Terminal QFN Package (4 mm × 4 mm)
• Accepts Any Differential Signaling:
LVDS, HSTL, CML, VML, SSTL-2, and
Single-Ended: LVTTL/LVCMOS
DESCRIPTION
The CDCP1803 clock driver distributes one pair of
differential clock inputs to three pairs of LVPECL
differential clock outputs Y[2:0] and Y[2:0] with
minimum skew for clock distribution. The CDCP1803
is specifically designed for driving 50-Ω transmission
lines.
The CDCP1803 has three control terminals, S0, S1,
and S2, to select different output mode settings; see
Table 1 for details. The CDCP1803 is characterized
for operation from –40°C to 85°C. For use in single-
ended driver applications, the CDCP1803 also
provides a VBB output terminal that can be directly
connected to the unused input as a common-mode
voltage reference.
RGE PACKAGE
(TOP VIEW)
EN
VDDPECL
IN
IN
VDDPECL
VBB
24 23 22 21 20 19
1
18
2
17
3
VSS(1)
16
4
15
5
14
6
13
7 8 9 10 11 12
S0
VDD1
Y1
Y1
VDD1
VSS
(1) Thermal pad must be connected to VSS.
RTH PACKAGE
(TOP VIEW)
P0024-02
EN 1
VDDPECL 2
IN 3
IN 4
VDDPECL 5
VBB 6
VSS(1)
18 S0
17 VDD1
16 Y1
15 Y1
14 VDD1
13 VSS
(1) Thermal pad must be connected to VSS.
P0025-02
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2003–2013, Texas Instruments Incorporated