BQ24700_14 Datasheet, PDF (1/32 Pages) Texas Instruments – NOTEBOOK PC BATTERY CHARGE CONTROLLER

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bq24700, bq24701
NOTEBOOK PC BATTERY CHARGE CONTROLLER
AND SELECTOR WITH DPM
SLUS452B – APRIL 2001 – REVISED NOVEMBER 2002
D Dynamic Power Management, DPM
Minimizes Battery Charge Time
D Integrated Selector Supports Battery
Conditioning and Smart Battery Learn
Cycle
D Selector Feedback Circuit Insures
Break-Before-Make Transition
D ±0.4% Charge Voltage Accuracy, Suitable
for Charging Li-Ion Cells
D ±4% Charge Current Accuracy
D 300-kHz Integrated PWM Controller for
High-Efficiency Buck Regulation
D Depleted Battery Detection and Indication
to Protect Battery From Over Discharge
D 15-µA Sleep Mode Current for Low Battery
Drain
D Designed for Charge Management of
NiCd/NiMH and Li-Ion/Li-Pol Battery Packs
D 24-Pin TSSOP Package
application schematic
PW PACKAGE
(TOP VIEW)
ACDET ₁
ACPRES ₂
ACSEL ₃
BATDEP 4
SRSET 5
ACSET 6
VREF 7
ENABLE 8
BATSET 9
COMP 10
ACN 11
ACP 12
24 ^ACDRV
23 ^BATDRV
22 ^VCC
21 PWM
20 VHSP
19 ALARM
18 VS
17 GND
16 SRP
15 SRN
14 IBAT
13 BATP
D1
R5
ADAPTER MBRD640CT _0.025
SUPPLY
DPAK
1W
100 kΩ
100Ω
1 µF
R1
499 kΩ
Q2
IRFR5305
33 µH
D05022p–333
100Ω
bq24700PW
11 ACN
ACDRV 24
Q1
IRFR5305
220µF
30 V
D1
MBRD640CT
DPAK
R6
0.05
0.5 W
12 ACP
VCC 22
4.7 Ω
VBAT
R7
523 k Ω
1 ACDET PWM 21
8 ENABLE SRP 16
3 ACSEL
SRN 15
19 ALARM BATP 13
5 SRSET BATDRV 23
6 ACSET
VS 18
2 ACPRES VHSP 20
4.7µF
C3 10µ F
B330
B330
R10
20Ω
10Ω
12.6 V +
R9
57.6 k Ω
100 kΩ
J1
D3
18 V
Q3
IRFR5305
C5, C6
22 µF
x2
35 V
D4
17 V
TO SYSTEM
D4
17 V
R14
523 k Ω
R15
57.6 k Ω
VCC
20 k Ω
5VREF
C7
3.3µF C8 150 pF
C9 R13
4.7µF 100Ω
14 IBAT
7 VREF
10 _COMP
BATSET 9
BATDEP 4
GND 17
CHARGE VOLTAGE SETPOINT
C4
10 µF
35 V
499 k Ω
180 pF 76.8 kΩ
VBAT
UDG–00138
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2002, Texas Instruments Incorporated
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