ADS7864_14 Datasheet, PDF (1/28 Pages) Texas Instruments – 500kHz, 12-Bit, 6-Channel Simultaneous Sampling ANALOG-TO-DIGITAL CONVERTER

BurrĆBrown Products
from Texas Instruments
ADS7864
SBAS141A – SEPTEMBER 2000 – REVISED MARCH 2005
500kHz, 12-Bit, 6-Channel Simultaneous Sampling
ANALOG-TO-DIGITAL CONVERTER
FEATURES
• 6 Simultaneous Sampling Channels
• Fully Differential Inputs
• 2µs Total Throughput per Channel
• No Missing Codes
• Parallel Interface
• 1MHz Effective Sampling Rate
• Low Power: 50mW
• 6X FIFO
APPLICATIONS
• Motor Control
• Multi-Axis Positioning Systems
• 3-Phase Power Control
DESCRIPTION
The ADS7864 is a dual 12-bit, 500kHz
analog-to-digital (A/D) converter with 6 fully differen-
tial input channels grouped into three pairs for high
speed simultaneous signal acquisition. Inputs to the
sample-and-hold amplifiers are fully differential and
are maintained differential to the input of the A/D
converter. This provides excellent common-mode re-
jection of 80dB at 50kHz which is important in high
noise environments.
The ADS7864 offers a parallel interface and control
inputs to minimize software overhead. The output
data for each channel is available as a 16-bit word
(address and data). The ADS7864 is offered in a
TQFP-48 package and is fully specified over the
–40°C to +85°C operating range.
HOLDA
CH A0+
CH A0−
HOLDB
CH B0+
CH B0−
HOLDC
CH C1+
CH C1−
REF_IN
REF_OUT
CH A1+
CH A1−
CH B1+
CH B1−
CH C1+
CH C1−
S/H
Amp
S/H
Amp
S/H
Amp
MUX
S/H
Amp
S/H
Amp
S/H
Amp
MUX
SAR
CDAC
COMP
Internal
2.5V
Reference
CDAC
COMP
SAR
Interface
A2
A1
Conversion
and
Control
A0
BYTE
CLOCK
CS
RD
BUSY
RESET
FIFO
Registers
Channel/
16
Data Output
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2005, Texas Instruments Incorporated