ADS7800KUE4 Datasheet, PDF (1/20 Pages) Texas Instruments – 12-Bit 3μs Sampling ANALOG-TO-DIGITAL CONVERTER

ADS7800
SBAS001A – OCTOBER 1989 – REVISED FEBRUARY 2004
12-Bit 3µs Sampling
ANALOG-TO-DIGITAL CONVERTER
FEATURES
q 333k SAMPLES PER SECOND
q STANDARD ±10V AND ±5V INPUT RANGES
q DC PERFORMANCE OVER TEMP:
No Missing Codes
1/2LSB Integral Linearity Error
3/4LSB Differential Linearity Error
q AC PERFORMANCE OVER TEMP:
72dB Signal-to-Noise Ratio
80dB Spurious-Free Dynamic Range
–80dB Total Harmonic Distortion
q INTERNAL SAMPLE/HOLD, REFERENCE,
CLOCK, AND THREE-STATE OUTPUTS
q POWER DISSIPATION: 215mW max
q PACKAGE: 24-Pin Single-Wide DIP
24-Lead SOIC
DESCRIPTION
The ADS7800 is a complete 12-bit sampling analog-to-
digital (A/D) converter using state-of-the-art CMOS
structures. It contains a complete 12-bit successive
approximation A/D converter with internal sample/hold,
reference, clock, digital interface for microprocessor
control, and three-state output drivers.
The ADS7800 is specified at a 333kHz sampling rate.
Conversion time is factory set for 2.70µs max over
temperature, and the high-speed sampling input stage
insures a total acquisition and conversion time of 3µs
max over temperature. Precision, laser-trimmed scaling
resistors provide industry-standard input ranges of ±5V
or ±10V.
AC and DC performance are completely specified. Two
grades based on linearity and dynamic performance are
available to provide the optimum price/performance fit in
a wide range of applications.
The 24-pin ADS7800 is available in plastic and side-
braze hermetic 0.3" wide DIPs, and in an SOIC package.
It operates from a +5V supply and either a –12V or –15V
supply. The ADS7800 is available in grades specified
over 0°C to +70°C and –40°C to +85°C temperature
ranges.
±10V_IN
±5V_IN
2V
Reference
Out
Control
Logic
Clock
CDAC
SAR
Internal
Ref
Comparator
Output
Latches
And
Three
State
Drivers
BUSY
Three
State
Parallel
Output
Data
Bus
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PRODUCTION DATA information is current as of publication date.
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standard warranty. Production processing does not necessarily include
testing of all parameters.
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