74ACT11074_14 Datasheet, PDF (1/14 Pages) Texas Instruments – DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET

74ACT11074
DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP
WITH CLEAR AND PRESET
SCAS498A – DECEMBER 1986 – REVISED APRIL 1996
D Inputs Are TTL-Voltage Compatible
D Center-Pin V_CC and GND Configurations to
Minimize High-Speed Switching Noise
D EPICt (Enhanced-Performance Implanted
CMOS) 1-mm Process
D 500-mA Typical Latch-Up Immunity
at 125°C
D Package Options Include Plastic
Small-Outline (D) and Shrink Small-Outline
(DB) Packages, and Standard Plastic
300-mil DIPs (N)
D, DB, OR N PACKAGE
(TOP VIEW)
1PRE 1
1Q 2
1Q 3
GND 4
2Q 5
2Q ⁶
2PRE ⁷
14 1CLK
13 1D
12 1CLR
11 V_CC
10 _2CLR
9 _2D
8 _2CLK
description
This device contains two independent positive-edge-triggered D-type flip-flops. A low level at the preset (PRE)
or clear (CLR) input sets or resets the outputs regardless of the levels of the other inputs. When PRE and CLR
are inactive (high), data at the data (D) input meeting the setup-time requirements are transferred to the outputs
on the low-to-high transition of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly
related to the rise time of the clock pulse. Following the hold time interval, data at the D input may be changed
without affecting the levels at the outputs.
The 74ACT11074 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
INPUTS
OUTPUTS
PRE CLR CLK D
Q
Q
L
H
X
X
H
L
H
L
X
X
L
H
L
L
X
X
H^{ H^{
H
H
↑
H
H
L
H
H
↑
L
L
H
H
H
L
X
Q0 Q0
† _{This configuration is unstable; that is, it does not}
persist when either PRE or CLR returns to its
inactive (high) level.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
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