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TS3L500AE_08 Datasheet, PDF (9/17 Pages) Texas Instruments – 16-BIT TO 8-BIT SPDT GIGABIT LAN SWITCH WITH LED SWITCH AND ENHANCED ESD PROTECTION
TS3L500AE
www.ti.com ....................................................................................................................................................... SCDS246A – JUNE 2007 – REVISED AUGUST 2008
PARAMETER MEASUREMENT INFORMATION
(Skew)
Input Generator
50 Ω
VG1
Input Generator
50 Ω
VG2
VIN
50 Ω
VI
50 Ω
VCC
DUT
TEST CIRCUIT
VO
CL
(see Note A)
RL
RL
2 × VCC
S1
Open
GND
TEST
tsk(o)
tsk(p)
VCC
3.3 V ± 0.3 V
3.3 V ± 0.3 V
S1
Open
Open
RL
200 Ω
200 Ω
Vin
VCC or GND
VCC or GND
CL
10 pF
10 pF
VI
Data In at
Ax or Ay
VO Data Out at
XB1 or XB2
VO Data Out at
YB1 or YB2
tPLHx
tPHLx
3.5 V
2.5 V
1.5 V
VOH
(VOH + VOL)/2
VOL
tsk(o)
tPLHy
tsk(o)
VOH
(VOH + VOL)/2
VOL
tPHLy
tsk(o) = |tPLHy − tPLHx| or |tPHLy − tPHLx|
VOLTAGE WAVEFORMS
OUTPUT SKEW (tsk(o))
Input
3.5 V
2.5 V
1.5 V
Output
tPLH
tPHL
VOH
(VOH + VOL)/2
VOL
tsk(p) = |tPHL − tPLH|
VOLTAGE WAVEFORMS
PULSE SKEW [tsk(p)]
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
Figure 6. Test Circuit and Voltage Waveforms
Copyright © 2007–2008, Texas Instruments Incorporated
Product Folder Link(s): TS3L500AE
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