TLC352 Datasheet, PDF (8/9 Pages) Texas Instruments – LinCMOSE DUAL DIFFERENTIAL COMPARATOR

TLC352
LinCMOS™ DUAL DIFFERENTIAL COMPARATOR
SLCS016 – SEPTEMBER 1985 – REVISED OCTOBER 1990
PARAMETER MEASUREMENT INFORMATION
Response time is defined as the interval between the application of an input step function and the instant when the
output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the leading
edge of the input pulse, while response time, high-to-low level output, is measured from the trailing edge of the input
pulse. Response-time measurement at low input signal levels can be greatly affected by the input offset voltage. The
offset voltage should be balanced by the adjustment at the inverting input (as shown in Figure 3) so that the circuit
is just at the transition point. Then a low signal, for example 105-mV or 5-mV overdrive, causes the output to change
state.
VDD
Pulse Generator
50 Ω
1V
Input
Offset Voltage
Compensation
Adjustment
–1V
10 Ω
10 Turn
1 kΩ
DUT
0.1 mF
5.1 kΩ
1 µF
CL
(see Note A)
TEST CIRCUIT
Overdrive
Input
Low-to-High-
Level Output
50 %
tPLH
100 mV
Input
100 mV
90%
10%
tr
High-to-Low-
Level Output
Overdrive
90%
50%
10%
tf
tPHL
VOLTAGE WAVEFORMS
NOTE A: CL includes probe and jig capacitance.
Figure 3. Response, Rise, and Fall Times Circuit and Voltage Waveforms
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