DAC5681_15 Datasheet, PDF (8/48 Pages) Texas Instruments – 16-BIT, 1.0 GSPS Digital-to-Analog Converter (DAC)

DAC5681
SLLS864C – AUGUST 2007 – REVISED AUGUST 2012
www.ti.com
ELECTRICAL CHARACTERISTICS — AC SPECIFICATION⁽¹⁾
Over recommended operating free-air temperature range, AVDD, IOVDD = 3.3 V, CLKVDD, DVDD = 1.8 V, IOUT_FS = 20 mA,
4:1 transformer output termination, 50Ω doubly terminated load (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
ANALOG OUTPUT
f_CLK
t_s(DAC)
t_pd
Maximum output update rate
Output settling time to 0.1%
Output propagation delay
Transition: Code 0x0000 to 0xFFFF
DAC output is updated on falling edge of DAC clock.
Does not include Digital Latency (see below).
1000
10.4
2.5
MSPS
ns
ns
t_r(IOUT)
t_f(IOUT)
Output rise time 10% to 90%
Output fall time 90% to 10%
Digital Latency
220
ps
220
ps
DAC
76
clock
cycles
DAC Wake-up Time⁽²⁾
Power-up
Time
DAC Sleep Time ⁽³⁾
BiasLPF_A enabled; register 0x06, Bit 3 set to 1.
BiasLPF_A disabled; register 0x06, Bit 3 set to 0.
BiasLPF_A enabled; register 0x06, Bit 3 set to 1.
BiasLPF_A disabled; register 0x06, Bit 3 set to 0.
8
μs
80
μs
8
μs
80
μs
AC PERFORMANCE
SFDR
Spurious free dynamic range
CLKIN = 500 MHz, IF = 5.1 MHz,
First Nyquist Zone < f_DATA/2
CLKIN = 1000 MHz, IF = 5.1 MHz,
First Nyquist Zone < f_DATA/2
CLKIN = 1000 MHz, IF = 20.1 MHz,
First Nyquist Zone < f_DATA/2
CLKIN = 500 MHZ, Single tone, 0 dBFS,
IF = 20.1 MHz
81
80
dBc
77
75
CLKIN = 1000 MHZ, Single tone, 0 dBFS,
IF = 20.1 MHz
70
SNR
Signal-to-noise ratio
CLKIN = 1000 MHZ, Single tone, 0 dBFS,
IF = 70.1 MHz
CLKIN = 1000 MHZ, Single tone, 0 dBFS,
IF = 180 MHz
66
dBc
60
CLKIN = 1000 MHZ, Single tone, 0 dBFS,
IF = 300.2 MHz
60
CLKIN = 1000 MHZ, Four tone, each -12 dBFS,
IF = 24.7, 24.9, 25.1 and 25.3 MHz
73
IMD3
Third-order two-tone
intermodulation
(each tone at –6 dBFS)
CLKIN = 1000 MHZ, IF = 20.1 and 21.1 MHz
CLKIN = 1000 MHZ, IF = 70.1 and 71.1 MHz
CLKIN = 1000 MHZ, IF = 150.1 and 151.1 MHz
88
75
dBc
67
IMD
Four-tone intermodulation
(each tone at –12 dBFS)
CLKIN = 1000 MHz, IF = 298.4, 299.2, 300.8 and 301.6 MHz
64
dBc
Single carrier, baseband, CLKIN = 983.04 MHz
80
83
ACLR⁽⁴⁾ Adjacent channel leakage ratio ^{Single carrier, IF = 180 MHz, CLKIN = 983.04 MHz}
Four carrier, IF = 180 MHz, CLKIN = 983.04 MHz
73
dBc
68
Four carrier, IF = 275 MHz, CLKIN = 983.04 MHz
66
Noise floor⁽⁵⁾
50-MHz offset, 1-MHz BW, Single Carrier, baseband,
CLKIN = 983.04
50-MHz offset, 1-MHz BW, Four Carrier, baseband,
CLKIN = 983.04
93
dBc
85
(1) Measured single-ended into 50 Ω load.
(2) IOUT current settling to 1% of IOUT_FS. Measured from SDENB rising edge; Register 0x06, toggle Bit 4 from 1 to 0.
(3) IOUT current settling to less than 1% of IOUT_FS. Measured from SDENB rising edge; Register 0x06, toggle Bit 4 from 0 to 1.
(4) W-CDMA with 3.84 MHz BW, 5-MHz spacing, centered at IF. TESTMODEL 1, 10 ms
(5) Carrier power measured in 3.84 MHz BW.
8
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