TRF7970A Datasheet, PDF (74/85 Pages) Texas Instruments – MULTI-PROTOCOL FULLY INTEGRATED 13.56-MHz RFID/NEAR FIELD COMMUNICATION

TRF7970A
SLOS743B – AUGUST 2011 – REVISED MARCH 2012
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6.3.4 Test Registers
6.3.4.1 Test Register (0x1A)
Table 6-31. Test Register (0x1A) (for Test or Direct Use)
Default: 0x00 at POR = H and EN = L.
Bit
Name
Function
B7
OOK_Subc_In Subcarrier Input
B6 MOD_Subc_Out Subcarrier Output
B5
MOD_Direct
Direct TX modulation and
RX reset
B4
o_sel
First stage output selection
B3
low2
Second stage gain -6 dB,
HP corner frequency/2
B2
low1
First stage gain -6 dB, HP
corner frequency/2
B1
zun
Input followers test
B0
Test_AGC
AGC test, AGC level is
seen on rssi_210 bits
Description
OOK Pin becomes decoder digital input
MOD Pin becomes receiver subcarrier output
MOD Pin becomes receiver subcarrier output
o_sel = L: Second Stage output used for analog out and digitizing
o_sel = H: Second Stage output used for analog out and digitizing
6.3.4.2 Test Register 0x1B
Table 6-32. Test Register (0x1B) (for Test or Direct Use)
Default: 0x00 at POR = H and EN = L. When a test_dec or test_io is set IC is switched to test mode. Test Mode persists until a stop
condition arrives. At stop condition the test_dec and test_io bits are cleared.
Bit
Name
Function
Description
B7
B6
test_rf_level RF level test
B5
B4
B3
test_io1
I/O test
B2
test_io0
Not implemented
B1
test_dec
Decoder test mode
B0
clock_su
Coder clock 13.56 MHz
For faster test of coders
74
Register Description
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