TLC372M Datasheet, PDF (7/20 Pages) Texas Instruments – LIN CMOS DUAL DIFFERENTIAL COMPARATORS

TLC372
LinCMOS DUAL DIFFERENTIAL COMPARATORS
SLCS114D − NOVEMBER 1983 − REVISED APRIL 2004
PARAMETER MEASUREMENT INFORMATION
Response time is defined as the interval between the application of an input step function and the instant when the
output reaches 50% of its maximum value. Response time, low-to-high level output, is measured from the leading
edge of the input pulse, while response time, high-to-low level output, is measured from the trailing edge of the input
pulse. Response-time measurement at low input signal levels can be greatly affected by the input offset voltage. The
offset voltage should be balanced by the adjustment at the inverting input as shown in Figure 3, so that the circuit
is just at the transition point. Then a low signal, for example 105-mV or 5-mV overdrive, causes the output to change
state.
VDD
Pulse
Generator
1V
Input Offset Voltage
Compensation Adjustment
−1 V
10 Ω
10 Turn
50 Ω
DUT
1 kΩ
0.1 µF
TEST CIRCUIT
5.1 kΩ
1 µF
CL
(see Note A)
Overdrive
Input
100 mV
100 mV
Input
Overdrive
90%
ÁÁÁ ^Low-to-High-
Level Output
50%
10%
High-to-Low-
Level Output
90%
50%
10%
tr
tPLH
tf
tPHL
VOLTAGE WAVEFORMS
NOTE A: CL includes probe and jig capacitance.
Figure 3. Response, Rise, and Fall Times Circuit and Voltage Waveforms
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