THS4521-HT_15 Datasheet, PDF (7/27 Pages) Texas Instruments – VERY LOW POWER, NEGATIVE RAIL INPUT,RAIL-TO-RAIL OUTPUT, FULLY DIFFERENTIAL AMPLIFIER

THS4521-HT
www.ti.com
SBOS548D – APRIL 2011 – REVISED MAY 2012
ELECTRICAL CHARACTERISTICS: V_S+ – V_S– = 3.3 V (continued)
At V_S+ = 3.3 V, V_S– = 0 V, V_OCM = open, V_OUT = 2 V_PP (differential), R_L = 1 kΩ differential, G = 1 V/V, single-ended input,
differential output, input and output referenced to midsupply, unless otherwise noted.
PARAMETER
CONDITIONS
-55°C to 125°C
175°C
MIN TYP MAX MIN TYP MAX
-55°C to 210°C
MIN TYP MAX UNIT
TEST
LEVEL ⁽¹⁾
Slew Rate
49
39
39
V/μs
C
Gain
0.97 0.99 1.02 0.97
1
1.03 0.97
1
1.03 V/V
A
Common-Mode Offset
Voltage from V_OCM
Input
Measured at V_OUT with V_OCM
input driven, V_OCM = 1.65 V
±0.5 V
±0.2 ±4
±0.7
±0.7 ±10 mV
A
Input Bias Current
V_OCM Voltage Range
V_OCM = 1.65 V ±0.5 V
±0.9 ±2.73
1.01
0.8 to
2.5
2.3
±0.27 ±2.75
±0.91 ±2.75 μA
A
0.8 to
2.5
1.09
0.8 to
2.5
2.3
V
A
Input Impedance
114∥3.
6
148∥3.
7
148∥3.
7
kΩ∥pF
C
Default Output
Common-Mode Voltage
Offset from
(V_S+– V_S–)/2
Measured at V_OUT
with V_OCM input open
±0.3 ±5
±0.6 ±10
±0.6 ±10 mV
A
1000000
100000
10000
1000
Output Load = 10 mA
Output Load = 25 mA
Output Load = 35 mA
100
110 120 130 140 150 160 170 180 190 200 210 220
Continuous T_J - °C
(1) See data sheet for absolute maximum and minimum recommended operating conditions.
(2) Silicon operating life design goal is 10 years at 105°C junction temperature (does not include package interconnect
life).
(3) The predicted operating lifetime vs. junction temperature is based on reliability modeling using electromigration as the
dominant failure mechanism affecting device wearout for the specific device process and design characteristics.
(4) Device is qualified to ensure reliable operation for 1000 hours at maximum rated temperature. This includes, but is
not limited to temperature bake, temperature cycle, electromigration, bond intermetallic life, and mold compound life.
Such qualification testing should not be viewed as justifying use of this component beyond specified performance and
environmental limits. For plastic package only.
Figure 1. THS4521SHKJ/SHKQ/SKGD1 Operating Life Derating Chart
Copyright © 2011–2012, Texas Instruments Incorporated
Product Folder Link(s): THS4521-HT
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