LMH6642Q-Q1_15 Datasheet, PDF (7/34 Pages) Texas Instruments – Low Power, 130 MHz, 75 mA Rail-to-Rail Output Amplifiers

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LMH6642Q-Q1, LMH6643Q-Q1
SNOSC61C – JANUARY 2012 – REVISED SEPTEMBER 2014
7.6 5V Electrical Characteristics
Unless otherwise specified, all limits ensured for V⁺ = 5V, V^− = 0V, V_CM = V_O = V⁺/2, V_ID (input differential voltage) as noted
(where applicable) and R_L = 2kΩ to V⁺/2. Boldface limits apply at the temperature extremes.
PARAMETER
TEST CONDITIONS
MIN ⁽¹⁾
TYP ⁽²⁾
MAX⁽¹⁾ UNIT
BW
−3dB BW
BW_0.1dB
PBW
e_n
0.1dB Gain Flatness
Full Power Bandwidth
Input-Referred Voltage Noise
A_V = +1, V_OUT = 200mV_PP
A_V = +2, −1, V_OUT = 200mV_PP
A_V = +2, R_L = 150Ω to V+/2,
R_f = 402Ω, V_OUT = 200mV_PP
A_V = +1, −1dB, V_OUT = 2V_PP
f = 100kHz
f = 1kHz
90
120
46
15
22
17
48
MHz
MHz
MHz
nV/√Hz
i_n
Input-Referred Current Noise
f = 100kHz
f = 1kHz
0.90
pA/√Hz
3.3
THD
DG
Total Harmonic Distortion
Differential Gain
DP
Differential Phase
CT Rej.
T_S
SR
V_OS
Cross-Talk Rejection
Settling Time
Slew Rate ⁽³⁾
Input Offset Voltage
TC V_OS
I_B
Input Offset Average Drift
Input Bias Current
f = 5MHz, V_O = 2V_PP, A_V = +2
NTSC, A_V = +2
R_L =150Ω to V⁺/2
R_L = 1kΩ to V⁺/2
NTSC, A_V = +2
R_L = 150Ω to V⁺/2
R_L = 1kΩ to V⁺/2
f = 5MHz, Receiver:
R_f = R_g = 510Ω, A_V = +2
V_O = 2V_PP, ±0.1%, 8pF Load
A_V = −1, V_I = 2V_PP
For LMH6642
For LMH6643
(4)
(5)
−60
0.16%
0.05%
0.05
0.01
47
68
95
125
±1
±5
±7
±1
±3.4
±7
±5
−1.70
−2.60
−3.25
dBc
deg
dB
ns
V/µs
mV
µV/°C
µA
I_OS
Input Offset Current
20
800
1000
nA
R_IN
Common Mode Input Resistance
C_IN
Common Mode Input
Capacitance
3
MΩ
2
pF
CMVR
Input Common-Mode Voltage
Range
CMRR ≥ 50dB
−0.5
−0.2
−0.1
V
3.8
3.6
4.0
CMRR
A_VOL
V_O
Common Mode Rejection Ratio
Large Signal Voltage Gain
Output Swing
High
Output Swing
Low
V_CM Stepped from 0V to 3.5V
V_O = 0.5V to 4.50V
R_L = 2kΩ to V⁺/2
V_O = 0.5V to 4.25V
R_L = 150Ω to V⁺/2
R_L = 2kΩ to V⁺/2, V_ID = 200mV
R_L = 150Ω to V⁺/2, V_ID = 200mV
R_L = 2kΩ to V⁺/2, V_ID = −200mV
R_L = 150Ω to V⁺/2, V_ID = −200mV
72
95
dB
86
82
98
dB
76
72
82
4.90
4.98
V
4.65
4.90
25 100
mV
100 150
(1) All limits are ensured by testing or statistical analysis.
(2) Typical values represent the most likely parametric norm.
(3) Slew rate is the average of the rising and falling slew rates.
(4) Offset voltage average drift determined by dividing the change in V_OS at temperature extremes by the total temperature change.
(5) Positive current corresponds to current flowing into the device.
Copyright © 2012–2014, Texas Instruments Incorporated
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