BQ27500_08 Datasheet, PDF (6/39 Pages) Texas Instruments – System-Side Impedance Track™ Fuel Gauge

bq27500
bq27501
System-Side Impedance Track™ Fuel Gauge
SLUS785D – SEPTEMBER 2007 – REVISED APRIL 2008
www.ti.com
3.8 INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS
T_A = –40°C to 85°C, 2.4 V < V_CC < 2.6 V; typical values at T_A = 25°C and V_CC = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP MAX
V_SR
t_{SR_CONV}
Input voltage range (V_SR = V_(SRN) – V_(SRP))
Conversion time
Resolution
Single conversion
–0.125
14
0.125
1
15
V_{SR_OS}
INL
Z_{SR_IN}
I_{SR_LKG}
Input offset
Integral nonlinearity error
Effective input resistance⁽¹⁾
Input leakage current⁽¹⁾
10
±0.007 ±0.034
2.5
0.3
(1) Specified by design. Not tested in production.
UNIT
V
s
bits
µV
% FSR
MΩ
µA
3.9 ADC (TEMPERATURE AND CELL MEASUREMENT) CHARACTERISTICS
T_A = –40°C to 85°C, 2.4 V < V_CC < 2.6 V; typical values at T_A = 25°C and V_CC = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP MAX
V_{ADC_IN}
t_{ADC_CONV}
Input voltage range
Conversion time
Resolution
–0.2
1
125
14
15
V_{ADC_OS}
Z_ADC1
Input offset
Effective input resistance (TS, RID
[bq27501 only])⁽¹⁾
1
8
Z_ADC2
I_{ADC_LKG}
Effective input resistance (BAT)⁽¹⁾
Input leakage current⁽¹⁾
bq27500/1 not measuring cell voltage
bq27500/1 measuging cell voltage
8
100
0.3
(1) Specified by design. Not tested in production.
UNIT
V
ms
bits
mV
MΩ
MΩ
kΩ
µA
3.10 DATA FLASH MEMORY CHARACTERISTICS
T_A = –40°C to 85°C, 2.4 V < V_CC < 2.6 V; typical values at T_A = 25°C and V_CC = 2.5 V (unless otherwise noted)
t_ON
t_WORDPROG
I_CCPROG
PARAMETER
Data retention⁽¹⁾
Flash-programming write cycles⁽¹⁾
Word programming time⁽¹⁾
Flash-write supply current⁽¹⁾
TEST CONDITIONS
MIN TYP
10
20,000
5
MAX
2
10
(1) Specified by design. Not production tested
UNIT
Years
Cycles
ms
mA
3.11 I²C-COMPATIBLE INTERFACE COMMUNICATION TIMING CHARACTERISTICS
T_A = –40°C to 85°C, 2.4 V < V_CC < 2.6 V; typical values at T_A = 25°C and V_CC = 2.5 V (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP MAX
t_r
t_f
t_w(H)
t_w(L)
t_su(STA)
t_d(STA)
t_su(DAT)
SCL/SDA rise time
SCL/SDA fall time
SCL pulse duration (high)
SCL pulse duration (low)
Setup for repeated start
Start to first falling edge of SCL
Data setup time
1
300
4
4.7
4.7
4
250
UNIT
µs
ns
µs
µs
µs
µs
ns
6
ELECTRICAL SPECIFICATIONS
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