BQ2203A Datasheet, PDF (6/12 Pages) Texas Instruments – NV Controller With Battery Monitor

bq2203A
AC Test Conditions
Parameter
Input pulse levels
Input rise and fall times
Input and output timing reference levels
Output load (including scope and jig)
CECON
510
Test Conditions
0V to 3.0V
5ns
1.5V (unless otherwise specified)
See Figure 3
5V
960
100pF
FG220102.eps
Figure 3. Output Load
Power-Fail Control (T_A = T_OPR)
Symbol
tPF
t_FS
t_PU
t_CED
Parameter
V_CC slew 4.75 to 4.25 V
VCC slew 4.25 V to VSO
VCC slew 4.25 to 4.75 V
Chip-enable propagation delay
tCER
Chip-enable recovery time
tRR
t_AS
tWPT
tR
tBC
VPFD to RST inactive
Input A set up to CE
Write-protect time
VPFD to RST active
VPFD to BCL/BCF active
Min.
300
10
0
40
tCER
0
40
tWPT
tCER
Typ.
-
-
-
7
80
-
-
100
-
-
Max.
-
-
-
10
120
tCER
-
150
tWPT
tCER
Unit
Conditions
µs
µs
µs
ns
Time during which SRAM is write-
ms protected after VCC passes VPFD on
power-up
ms
Time, after V_CC becomes valid, before
RST is cleared
ns
µs
Delay after V_CC slews down past
VPFD before SRAM is write-protected
µs
Delay after V_CC slews down past
VPFD before RST is active
ms
Delay after V_CC slews up past V_PFD
before BCL or BCF is active
Note:
Typical values indicate operation at TA = 25°C, VCC = 5V.
Caution: Negative undershoots below the absolute maximum rating of -0.3V in battery-backup mode
may affect data integrity.
Nov. 1994 B
6