82592 Datasheet, PDF (6/24 Pages) Texas Instruments – Precision, CMOS Input, RRIO, Wide Supply Range Amplifiers

Symbol
Parameter
V_OUT
Output Voltage Swing High
Output Voltage Swing Low
I_OUT
Output Current
(Notes 3, 9)
I_S
Supply Current
SR
Slew Rate (Note 10)
GBW
THD+N
e_n
i_n
Gain Bandwidth
Total Harmonic Distortion + Noise
Input Referred Voltage Noise Density
Input Referred Current Noise Density
Conditions
Min
(Note 6)
R_L = 2 kΩ to 0V
LMP7701
R_L = 2 kΩ to 0V
LMP7702/LMP7704
R_L = 10 kΩ to 0V
LMP7701
R_L = 10 kΩ to 0V
LMP7702/LMP7704
R_L = 2 kΩ to 0V
LMP7701
R_L = 2 kΩ to 0V
LMP7702/LMP7704
R_L = 10 kΩ to 0V
LMP7701
R_L = 10 kΩ to 0V
LMP7702/LMP7704
Sourcing V_O = 0V
50
V_IN = 100 mV (LMP7701)
35
Sourcing V_O = 0V
48
V_IN = 100 mV (LMP7702/LMP7704) 33
Sinking V_O = 0V
50
V_IN = −100 mV
35
LMP7701
LMP7702
LMP7704
A_V = +1, V_O = 9 V_PP
10% to 90%
f = 1 kHz, A_V = 1, R_L = 10 kΩ
f = 1 kHz
f = 100 kHz
Typ
(Note 5)
90
90
40
40
90
90
40
40
86
86
84
0.790
1.7
3.2
1.1
2.5
0.02
9
1
Max
(Note 6)
150
170
180
290
80
100
80
150
130
150
180
290
50
60
60
110
1.1
1.3
2.1
2.5
4.2
5.0
Units
mV
from V⁺
mV
from V^–
mA
mA
V/μs
MHz
%
nV/
fA/
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics
Tables.
Note 2: Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of JEDEC) Field-
Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).
Note 3: The maximum power dissipation is a function of T_J(MAX), θ_JA. The maximum allowable power dissipation at any ambient temperature is
P_D = (T_J(MAX) – T_A)/ θ_JA. All numbers apply for packages soldered directly onto a PC Board.
Note 4: Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating
of the device such that T_J = T_A. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where T_J >
T_A.
Note 5: Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will
also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material.
Note 6: Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using the Statistical Quality
Control (SQC) method.
Note 7: This parameter is guaranteed by design and/or characterization and is not tested in production.
Note 8: Positive current corresponds to current flowing into the device.
Note 9: The short circuit test is a momentary test.
Note 10: The number specified is the slower of positive and negative slew rates.
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