TLC5510INSR Datasheet, PDF (5/15 Pages) Texas Instruments – 8-BIT HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERS

TLC5510, TLC5510A
8-BIT HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERS
SLAS095L – SEPTEMBER 1994 – REVISED JUNE 2003
operating characteristics at V_DD = 5 V, V_REFT = 2.5 V, V_REFB = 0.5 V, f_(CLK) = 20 MHz, T_A = 25°C (unless
otherwise noted)
fconv
BW
td(D)
tAJ
td(s)
ten
tdis
PARAMETER
Maximum conversion rate
Analog input bandwidth
Digital output delay time
Differential gain
Differential phase
Aperture jitter time
Sampling delay time
TLC5510
TLC5510A
Enable time, OE↓ to valid data
Disable time, OE↑ to high impedance
Spurious free dynamic range (SFDR)
SNR Signal-to-noise ratio
NOTE 1: CL includes probe and jig capacitance.
TEST CONDITIONS
fI = 1-kHz ramp
At – 1 dB
VI(ANLG) = 0.5 V – 2.5 V
VI(ANLG) = 0 V – 4 V
CL ≤ 10 pF (see Note 1 and Figure 1)
NTSC 40 Institute of Radio Engineers (IRE)
modulation wave,
fconv = 14.3 MSPS
CL = 10 pF
CL = 10 pF
Input tone = 1 MHz
Input tone = 3 MHz
Input tone = 6 MHz
Input tone = 10 MHz
TA = 25°C
Full range
TA = 25°C
Full range
TA = 25°C
Full range
TA = 25°C
Full range
TA = 25°C
Full range
MIN TYP MAX UNIT
20 MSPS
20 MSPS
14
MHz
18
30 ns
1%
0.7
degrees
30
ps
4
ns
5
ns
7
ns
45
43
45
46
dB
43
42
39
39
46
dB
44
tw(H)
CLK (clock)
ANALOG IN
(input signal)
td(s)
N
tw(L)
N+1
N+2
D1 – D8
(output data)
N–3
td(D)
N–2
N–1
Figure 1. I/O Timing Diagram
N+3
N
N+4
N+1
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