DS10BR150 Datasheet, PDF (5/15 Pages) Texas Instruments – DC - 1.0 Gbps Low Jitter, High Noise Immunity, Low Power Operation

DS10BR150
www.ti.com
SNLS252D – APRIL 2007 – REVISED APRIL 2013
AC Electrical Characteristics ⁽¹⁾
Over recommended operating supply and temperature ranges unless otherwise specified. ⁽²⁾⁽³⁾
Symbol
Parameter
Conditions
Min Typ Max Units
LVDS OUTPUT AC SPECIFICATIONS (OUT+, OUT-)
t_PHLD2
Differential Propagation Delay High to Low
t_PLHD2
t_SKD1
t_SKD2
Differential Propagation Delay Low to High
Pulse Skew |t_PLHD − t_PHLD| ⁽⁴⁾
Part to Part Skew ⁽⁵⁾
t_LHT
Rise Time
t_HLT
Fall Time
JITTER PERFORMANCE Figure 5
R_L = 100Ω
R_L = 100Ω
380 600
ps
410 600
ps
30
150
ps
45
160
ps
165 400
ps
155 400
ps
t_DJ
Deterministic Jitter (Peak-to-Peak Value ) (See V_ID = 350 mV
622 Mbps
(6)₎
V_CM = 1.2V
K28.5 (NRZ)
1.06 Gbps
t_RJ
Random Jitter (RMS Value) ⁽⁷⁾
V_ID = 350 mV
V_CM = 1.2V
Clock (NRZ)
311 MHz
503 MHz
t_TJ
Total Jitter (Peak to Peak Value) ⁽⁸⁾
V_ID = 350 mV
V_CM = 1.2V
PRBS-23 (NRZ)
622 Mbps
1.06 Gbps
12
15
0.6
0.6
0.02
0.02
39
42
1.3
1.1
0.04
0.05
ps
ps
ps
ps
UI_P-P
UI_P-P
(1) Specification is ensured by characterization and is not tested in production.
(2) The Electrical Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except as
otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and
are not ensured.
(3) Typical values represent most likely parametric norms for V_CC = +3.3V and T_A = +25°C, and at the Recommended Operation Conditions
at the time of product characterization and are not ensured.
(4) t_SKD1, |t_PLHD − t_PHLD|, is the magnitude difference in differential propagation delay time between the positive going edge and the negative
going edge of the same channel.
(5) t_SKD2, Part to Part Skew, is defined as the difference between the minimum and maximum specified differential propagation delays. This
specification applies to devices at the same V_CC and within 5°C of each other within the operating temperature range.
(6) Tested with a combination of the 1100000101 (K28.5+ character) and 0011111010 (K28.5- character) patterns. Input stimulus jitter is
subtracted algebraically.
(7) Measured on a clock edge with a histogram and an accumulation of 1500 histogram hits. Input stimulus jitter is subtracted geometrically.
(8) Measured on an eye diagram with a histogram and an accumulation of 3500 histogram hits. Input stimulus jitter is subtracted.
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