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5962-7802301Q2A Datasheet, PDF (5/22 Pages) Texas Instruments – QUADRUPLE DIFFERENTIAL LINE DRIVER | |||
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AM26LS31C, AM26LS31M
QUADRUPLE DIFFERENTIAL LINE DRIVER
SLLS114I â JANUARY 1979 â REVISED FEBRUARY 2006
PARAMETER MEASUREMENT INFORMATION
Test Point
VCC
From Output
Under Test
CL
(see Note A)
S1
75 â¦
S2
180 â¦
PROPAGATION DELAY TIMES AND SKEW
Input A
(see Notes B
and C)
Output Y
tPHL
Output Z
1.3 V
tPLH
1.3 V
3V
0V
tPHL
Skew
1.5 V
1.5 V
Skew
tPLH
TEST CIRCUIT
VOH
VOL
VOH
VOL
Enable G
(see Note D)
Enable G
Waveform 1
(see Note E)
Waveform 2
(see Note E)
1.5 V
See Note D
1.5 V
tPZL
S1 Closed
S2 Open
tPZH
S1 Open
S2 Closed
tPLZ
â4.5 V
1.5 V
tPHZ
1.5 V
â0 V
ENABLE AND DISABLE TIME WAVEFORMS
3V
0V
S1 Closed
S2 Closed
0.5 V
â1.5 V
VOL
0.5 V
VOH
â1.5 V
S1 Closed
S2 Closed
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR ⤠1 MHz, ZO â 50 â¦, tr ⤠15 ns, tf ⤠6 ns.
C. When measuring propagation delay times and skew, switches S1 and S2 are open.
D. Each enable is tested separately.
E. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
Figure 1. Test Circuit and Voltage Waveforms
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