THS1050 Datasheet, PDF (4/20 Pages) Texas Instruments – 10-BIT 50 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER

THS1050
10-BIT 50 MSPS IF SAMPLING COMMUNICATIONS
ANALOG-TO-DIGITAL CONVERTER
SLAS278 – APRIL 2000
electrical characteristics over recommended operating free-air temperature range,
AV_DD = DV_DD = 5 V, DRV_DD = 3.3 V, internal references, CLK = 50 MHz (unless otherwise noted)^†
dc accuracy
PARAMETER
DNL
Differential nonlinearity
No missing codes
INL
Integral nonlinearity
EO
Offset error
EG
Gain error
† _{All typical values are at TA = 25°C.}
power supply
PARAMETER
I(AVDD) Analog supply current
I(DVDD) Digital supply current
I(DRVDD) Output driver supply current
PD
Power dissipation
† _{All typical values are at TA = 25°C.}
reference
PARAMETER
VREFOUT _– Negative reference output voltage
VREFOUT+ Positive reference output voltage
VREFIN _–
External reference supplied
VREFIN+
External reference supplied
V(VCM)
Common mode output voltage
I(VCM)
Common mode output current
† _{All typical values are at TA = 25°C.}
analog input
PARAMETER
RI Differential input resistance
CI Differential input capacitance
VI Analog input common mode range
VID Differential input voltage range
BW Analog input bandwidth (large signal)
† _{All typical values are at TA = 25°C.}
digital outputs
PARAMETER
VOH High-level output voltage
VOL
Low-level output voltage
CL
Output load capacitance
† _{All typical values are at TA = 25°C.}
TEST CONDITIONS
MIN TYP†
± 0.3
Assured
± 0.9
14
–7
MAX
±0.6
± 2.5
29
– 10
UNIT
LSB
LSB
mV
%FSR
TEST CONDITIONS
V(VIN) = V(VCM)
V(VIN) = V(VCM)
V(VIN) = V(VCM)
V(VIN) = V(VCM)
MIN TYP MAX UNIT
100 145 mA
2
5 mA
2
6 mA
0.5
W
TEST CONDITIONS
MIN TYP
1.95 2
2.95 3
2
3
AVDD/2
10
MAX
2.05
3.05
UNIT
V
V
V
V
V
µA
TEST CONDITIONS
–3 dB
MIN
TYP
900
4
VCM ± 0.05
2
82
MAX
UNIT
Ω
pF
V
V p-p
MHz
TEST CONDITIONS
IOH = – 50 µA
IOL = 50 µA
MIN
0.8DRVDD
TYP MAX
0.2DRVDD
15
UNIT
V
VDD
pF
4
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