SM73302_15 Datasheet, PDF (4/31 Pages) Texas Instruments – SM73302 88 MHz, Precision, Low Noise, 1.8V CMOS Input, Decompensated Operational Amplifier

SM73302
SNOSB93A – AUGUST 2011 – REVISED APRIL 2013
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5V Electrical Characteristics⁽¹⁾
Unless otherwise specified, all limits are specified for T_A = 25°C, V⁺ = 5V, V^− = 0V, V_CM = V⁺/2 = V_O. Boldface limits apply at
the temperature extremes.
Symbo
l
Parameter
Conditions
Min ⁽²⁾
Typ ⁽³⁾
Max ⁽²⁾
Units
V_OS
Input Offset Voltage
±10
±150
±450
µV
TC V_OS Input Offset Voltage Temperature
Drift ^{(4) (5)}
I_B
Input Bias Current
I_OS
Input Offset Current
V_CM = 2.0V ^{(6) (5)}
V_CM = 2.0V⁽⁵⁾
−40°C ≤ T_A ≤ 85°C
−40°C ≤ T_A ≤ 125°C
−1.0
0.1
0.1
.01
±4
μV/°C
1
25
pA
1
100
0.5
50
pA
CMRR Common Mode Rejection Ratio
PSRR Power Supply Rejection Ratio
CMVR Common Mode Voltage Range
0V ≤ V_CM ≤ 3.7V
2.0V ≤ V⁺ ≤ 5.5V, V_CM = 0V
1.8V ≤ V⁺ ≤ 5.5V, V_CM = 0V
CMRR ≥ 60 dB
CMRR ≥ 55 dB
85
100
80
dB
85
100
80
dB
85
98
−0.3
−0.3
4
4
V
A_VOL Open Loop Voltage Gain
V_OUT Output Voltage Swing High
Output Voltage Swing Low
V_OUT = 0.3V to
4.7V,
R_L = 2 kΩ to V⁺/2
V_OUT = 0.3V to
4.7V,
R_L = 10 kΩ to V⁺/2
R_L = 2 kΩ to V⁺/2
R_L = 10 kΩ to V⁺/2
R_L = 2 kΩ to V⁺/2
R_L = 10 kΩ to V⁺/2
88
107
82
dB
92
110
88
35
70
77
25
60
66
mV from
42
70 ^{either rail}
73
25
60
66
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T_J = T_A. No indication of parametric performance exists in the electrical tables under
conditions of internal self-heating where T_J > T_A.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4) Offset voltage average drift is determined by dividing the change in V_OS by temperature change.
(5) Parameter is specified by design and/or characterization and is not test in production.
(6) Positive current corresponds to current flowing into the device.
4
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