LP2951JAN_15 Datasheet, PDF (4/25 Pages) Texas Instruments – Series of Adjustable Micropower Voltage Regulators

LP2951JAN
SNVS408A – NOVEMBER 2010 – REVISED APRIL 2013
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings⁽¹⁾
Input Supply Voltage
Shutdown Input Voltage⁽²⁾
Error Comparator Output Voltage⁽²⁾
Feedback Input Voltage⁽²⁾⁽³⁾
Power Dissipation⁽⁴⁾
CDIP
Junction Temperature (T_J)
Ambient Storage Temperature Range
Ambient Operating Temperature Range
Lead Temperature (Soldering 10 Seconds)
Thermal Resistance
θ_JA
CDIP (Still Air at 0.5W)
CDIP (500LF/Min Air flow at 0.5W)
θ_JC
ESD Rating⁽⁵⁾
CDIP
−0.3 to +30V
−0.3 to +30V
−0.3 to +30V
−1.5 to +30V
1.0 W at 25°C
+160°C
−65°C ≤ T_A ≤ +150°C
−55°C ≤ T_A ≤ +125°C
260°C
131°C/W
75°C/W
21°C/W
500V
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The specified specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2) May exceed input supply voltage.
(3) When used in dual-supply systems where the output terminal sees loads returned to a negative supply, the output voltage should be
diode-clamped to ground.
(4) The maximum power dissipation must be derated at elevated temperatures and is dictated by T_Jmax (maximum junction temperature),
θ_JA (package junction to ambient thermal resistance), and T_A (ambient temperature). The maximum allowable power dissipation at any
temperature is P_Dmax = (T_Jmax – T_A)/θ_JA or the number given in the Absolute Maximum Ratings, whichever is lower.
(5) Human body model, 1.5 kΩ in series with 100 pF.
Table 1. Quality Conformance Inspection Mil-Std-883, Method 5005 - Group A
SUBGROUP
1
2
3
4
5
6
7
8A
8B
9
10
11
12
13
14
DESCRIPTION
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Settling time at
Settling time at
Settling time at
TEMP (°C)
+25
+125
–55
+25
+125
–55
+25
+125
–55
+25
+125
–55
+25
+125
–55
4
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