TLV320AIC10 Datasheet, PDF (39/57 Pages) Texas Instruments – General-Purpose 3V to 5.5V 16-bit 22-KSPS DSP CODEC

4.3.4 ADC Channel Characteristics
VI(PP)
EG
EO(ADC)
CMRR
Rj
PARAMETER
Peak-to-peak input voltage (differential)
Dynamic range
Intrachannel isolation
Gain error
ADC converter offset error
Common-mode rejection ratio at INM, INP or AUXM, AUXP
Idle channel noise (on-chip reference)
Input resistance
Channel delay
TEST CONDITIONS
Preamp gain = 0 dB
VI = –3 dB
VI = –1 dB at 1020 Hz
VI = –1 dB at 1020 Hz
VINP,INM = 0 V
TA = 25°C
MIN TYP MAX UNIT
4V
82
dB
87
dB
0.6
dB
±15
mV
80
dB
25
70 µVrms
35
kΩ
17/fs
s
4.3.5 DAC Path Filter, Fs = 8 kHz (see Note 4)
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
0 Hz to 300 Hz
–0.5
0.2
300 Hz to 3 kHz
–0.65
0.25
Filter gain relative to gain at 1020 Hz
3.3 kHz
3.6 kHz
–0.75
0.3
dB
–3
4 kHz
–35
≥ 4.4 kHz
–74
NOTE 4: The filter gain outside of the passband is measured with respect to the gain at 1020 Hz. The input signal is the digital equivalent of a
sine wave (digital full scale = 0 dB). The nominal differential DAC channel output with this input condition is 6 VI(PP). The pass band
is 0 to 3600 Hz for an 8-kHz sample rate. This pass band scales linearly with the conversion rate.
4.3.6 DAC Dynamic Performance
4.3.6.1 DAC Signal-to-Noise When Load is 600 Ω (see Note 5)
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
VI = 0 dB
80
85
SNR Signal-to-noise ratio
VI = –3 dB
VI = –9 dB
78
84
dB
72
78
VI = –40 dB
35
42
NOTE 5: The test condition is the digital equivalent of a 1020 Hz input signal with an 8-kHz conversion rate. The test is measured at output of
application schematic low-pass filter. The test is conducted in 16-bit mode.
4.3.6.2 DAC Signal-to-Distortion when load is 600 Ω. (see Note 5)
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
VI = 0 dB
70
77
THD Signal-to-total harmonic distortion
VI = –3 dB
VI = –9 dB
78
85
dB
78
85
VI = –40 dB
62
66
NOTE 5: The test condition is the digital equivalent of a 1020 Hz input signal with an 8-kHz conversion rate. The test is measured at output of
application schematic low-pass filter. The test is conducted in 16-bit mode.
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