MSP430FE42XA Datasheet, PDF (33/44 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER

MSP430FE42xA
MIXED SIGNAL MICROCONTROLLER
SLAS588 -- FEBRUARY 2008
electrical characteristics over recommended operating free-air temperature (unless otherwise
noted) (continued)
flash memory
PARAMETER
TEST
CONDITIONS
V_CC
MIN NOM MAX UNIT
V_CC(PGM/
ERASE)
Program and erase supply voltage
2.7
3.6 V
f_FTG
Flash timing generator frequency
257
476 kHz
I_PGM
Supply current from DV_CC during program
2.7 V/ 3.6 V
3
5 mA
I_ERASE
Supply current from DV_CC during erase
2.7 V/ 3.6 V
3
7 mA
t_CPT
Cumulative program time
see Note 1
2.7 V/ 3.6 V
10 ms
t_CMErase
Cumulative mass erase time
Program/erase endurance
see Note 2
2.7 V/ 3.6 V 200
10⁴ 10⁵
ms
cycles
t_Retention
Data retention duration
T_J = 25°C
100
years
t_Word
Word or byte program time
35
t_{Block, 0}
Block program time for 1^st byte or word
30
t_{Block, 1-63}
t_{Block, End}
Block program time for each additional byte or word
see Note 3
Block program end-sequence wait time
21
6
t_FTG
t_{Mass Erase}
Mass erase time
5297
t_{Seg Erase}
Segment erase time
4819
NOTES: 1. The cumulative programming time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all
programming methods: individual word/byte write and block write modes.
2. The mass erase duration generated by the flash timing generator is at least 11.1ms ( = 5297x1/f_FTG,max = 5297x1/476kHz). To
achieve the required cumulative mass erase time the Flash Controller’s mass erase operation can be repeated until this time is met.
(A worst case minimum of 19 cycles are required).
3. These values are hardwired into the Flash Controller’s state machine (t_FTG = 1/f_FTG).
JTAG interface
PARAMETER
TEST
CONDITIONS
V_CC
f_TCK
TCK input frequency
see Note 1
2.2 V
3V
R_Internal
Internal pullup resistance on TMS, TCK, TDI/TCLK see Note 2
2.2 V/ 3 V
NOTES: 1. f_TCK may be restricted to meet the timing requirements of the module selected.
2. TMS, TDI/TCLK, and TCK pull-up resistors are implemented in all versions.
MIN NOM MAX UNIT
0
5 MHz
0
10 MHz
25
60
90 kΩ
JTAG fuse (see Note 1)
PARAMETER
TEST
CONDITIONS
V_CC
MIN NOM MAX UNIT
V_CC(FB)
Supply voltage during fuse-blow condition
T_A = 25°C
2.5
V
V_FB
Voltage level on TDI/TCLK for fuse-blow
6
7V
I_FB
Supply current into TDI/TCLK during fuse-blow
100 mA
t_FB
Time to blow fuse
1 ms
NOTES: 1. Once the fuse is blown, no further access to the MSP430 JTAG/Test and emulation features is possible. The JTAG block is switched
to bypass mode.
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