MSP430F42X0_07 Datasheet, PDF (33/63 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER

MSP430F42x0
MIXED SIGNAL MICROCONTROLLER
SLAS455D − MARCH 2005 − REVISED APRIL 2007
electrical characteristics over recommended operating free-air temperature (unless otherwise
noted) (continued)
12-bit DAC, linearity specifications (see Figure 12)
PARAMETER
Resolution
TEST CONDITIONS
(12-bit Monotonic)
V_CC
MIN TYP MAX UNIT
12
bits
INL
Integral nonlinearity
V_REF,DAC12 = 1.2V
2.7V
(see Note 1)
DAC12AMPx = 7, DAC12IR = 1
±2.0 ±8.0 LSB
DNL
Differential nonlinearity
(see Note 1)
V_REF,DAC12 = 1.2V
DAC12AMPx = 7, DAC12IR = 1
2.7V
±0.4 ±1.0 LSB
Offset voltage w/o
calibration
V_REF,DAC12 = 1.2V
2.7V
E_O
(see Notes 1, 2)
DAC12AMPx = 7, DAC12IR = 1
Offset voltage with
calibration
(see Notes 1, 2)
V_REF,DAC12 = 1.2V
DAC12AMPx = 7, DAC12IR = 1
2.7V
±20
mV
±2.5
d_E(O)/d_T
E_G
d_E(G)/d_T
Offset error
temperature coefficient
(see Note 1)
Gain error (see Note 1)
Gain temperature
coefficient (see Note 1)
V_REF,DAC12 = 1.2V
2.7V
2.7V
2.7V
±30
μV/C
±3.50 % FSR
10
ppm of
FSR/°C
t_{Offset_Cal}
Time for offset calibration
(see Note 3)
DAC12AMPx=2
DAC12AMPx=3,5
DAC12AMPx=4,6,7
2.7V
2.7V
2.7V
100
32 ms
6
NOTES:
1. Parameters calculated from the best-fit curve from 0x0A to 0xFFF. The best-fit curve method is used to deliver coefficients “a” and
“b” of the first order equation: y = a + b*x. V_{DAC12_xOUT} = E_O + (1 + E_G) * (V_REF,DAC12/4095) * DAC12_xDAT, DAC12IR = 1.
2. The offset calibration works on the output operational amplifier. Offset Calibration is triggered setting bit DAC12CALON
3. The offset calibration can be done if DAC12AMPx = {2, 3, 4, 5, 6, 7}. The output operational amplifier is switched off with
DAC12AMPx ={0, 1}. It is recommended that the DAC12 module be configured prior to initiating calibration. Port activity during
calibration may effect accuracy and is not recommended.
DAC Output
RLoad =
AV _CC
2
CLoad = 100pF
DAC VOUT
VR+
Ideal transfer
function
Offset Error
Positive
Negative
Gain Error
DAC Code
Figure 12. Linearity Test Load Conditions and Gain/Offset Definition
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