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| SN74ABT18502 Datasheet, PDF (3/28 Pages) Texas Instruments – SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER | |||
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functional block diagram
1LEAB 60
59
1CLKAB
1OEAB 62
1LEBA 54
1CLKBA 55
53
1OEBA
1A1 63
SN74ABT18502
SCAN TEST DEVICE
WITH 18-BIT REGISTERED BUS TRANSCEIVER
SCBS753 â FEBRUARY 2002
Boundary-Scan Register (BSR)
C1
C1
One of Nine Channels
1D
1D
C1
C1
1D
1D
51 1B1
2LEAB 22
2CLKAB 23
2OEAB 21
2LEBA 28
2CLKBA 27
2OEBA 30
10
2A1
VCC
24
TDI
VCC
TMS 56
TCK 26
C1
C1
One of Nine Channels
1D
1D
C1
C1
1D
1D
Bypass Register
Boundary-Control
Register (BCR)
Identification
Register (IDR)
Instruction
Register (IR)
TAP
Controller
40
2B1
58 TDO
⢠POST OFFICE BOX 655303 DALLAS, TEXAS 75265
3
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