SN74ABT18502 Datasheet, PDF (1/28 Pages) Texas Instruments – SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER

SN74ABT18502
SCAN TEST DEVICE
WITH 18-BIT REGISTERED BUS TRANSCEIVER
SCBS753 – FEBRUARY 2002
D Member of the Texas Instruments
Widebus Family
D UBT Transceiver Combines D-Type
Latches and D-Type Flip-Flops for
Operation in Transparent, Latched, or
Clocked Mode
D Compatible With IEEE Std 1149.1-1990
(JTAG) Test Access Port (TAP) and
Boundary-Scan Architecture
D Includes D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data
D Two Boundary-Scan Cells (BSCs) Per I/O
for Greater Flexibility
D SCOPE Instruction Set
– IEEE Std 1149.1-1990 Required
Instructions, Optional INTEST, and
P1149.1A CLAMP and HIGHZ
– Parallel Signature Analysis (PSA) at
Inputs With Masking Option
– Pseudorandom Pattern Generation
(PRPG) From Outputs
– Sample Inputs/Toggle Outputs (TOPSIP)
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
PM PACKAGE
(TOP VIEW)
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
V_CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49
1
48
2
47
3
46
4
45
5
44
6
43
7
42
8
41
9
40
10
39
11
38
12
37
13
36
14
35
15
34
16
33
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
1B4
1B5
1B6
GND
1B7
1B8
1B9
V_CC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, UBT, and Widebus are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  2002, Texas Instruments Incorporated
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
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