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LP2985AIM5X-2.0 Datasheet, PDF (3/22 Pages) Texas Instruments – LP2985LV-N Micropower 150 mA Low-Noise Low-Dropout Regulator in SOT-23 and DSBGA packages for Applications with Output Voltages 2.0V
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LP2985LV-N
www.ti.com
SNOS510P – NOVEMBER 1999 – REVISED APRIL 2013
ABSOLUTE MAXIMUM RATINGS(1)(2)
Storage Temperature Range
Operating Junction Temperature Range
Lead Temp. (Soldering, 5 sec.)
ESD Rating(3)
Power Dissipation(4)
Input Supply Voltage (Survival)
Input Supply Voltage (Operating)
Shutdown Input Voltage (Survival)
Output Voltage (Survival(5))
IOUT (Survival)
Input-Output Voltage (Survival(6))
−65°C to +150°C
−40°C to +125°C
260°C
2 kV
Internally Limited
−0.3V to +16V
2.2V to +16V
−0.3V to +16V
−0.3V to +9V
Short Circuit Protected
−0.3V to +16V
(1) Absolute Maximum Ratings indicate limits beyond which damage to the component may occur. Electrical specifications do not apply
when operating the device outside of its rated operating conditions.
(2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
(3) The ESD rating of pins 3 and 4 for the SOT-23 package, or pins 5 and 2 for the DSBGA package, is 1 kV.
(4) The maximum allowable power dissipation is a function of the maximum junction temperature, TJ(MAX), the junction-to-ambient thermal
resistance, θJ-A, and the ambient temperature, TA. The maximum allowable power dissipation at any ambient temperture is calculated
using:
Where the value of θJ-A for the SOT-23 package is 220°C/W in a typical PC board mounting. Exceeding the maximum allowable
dissipation will cause excessive die temperature, and the regulator will go into thermal shutdown.
(5) If used in a dual-supply system where the regulator load is returned to a negative supply, the LP2985LV-N output must be diode-
clamped to ground.
(6) The output PNP structure contains a diode between the VIN to VOUT terminals that is normally reverse-biased. Reversing the polarity
from VIN to VOUT will turn on this diode, and possibly damage the device (See APPLICATION HINTS).
Copyright © 1999–2013, Texas Instruments Incorporated
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