English
Language : 

DAC5573 Datasheet, PDF (3/30 Pages) Texas Instruments – QUAD, 8-BIT, LOW-POWER, VOLTAGE OUTPUT, INTERFACE DIGITAL-TO-ANALOG CONVERTER
DAC5573
www.ti.com
SLAS401 – NOVEMBER 2003
ELECTRICAL CHARACTERISTICS
VDD = 2.7 V to 5.5 V, RL = 2 kΩ to GND; CL = 200 pF to GND; all specifications -40°C to +105°C, unless otherwise specified.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNITS
STATIC PERFORMANCE(1)(2)
Resolution
8
Bits
Relative accuracy
±0.25
±0.5
LSB
Differential nonlinearity
Specified monotonic by design
±0.1
± 0.25
LSB
Zero-scale error
5
20
mV
Full-scale error
-0.15
±1.0
% of FSR
Gain error
±1.0
% of FSR
Zero code error drift
±7
µV/°C
Gain temperature coefficient
±3
ppm of FSR/°C
OUTPUT CHARACTERISTICS(3)
Output voltage range
Output voltage settling time (full scale)
Slew rate
0
RL = ∞; 0 pF < CL < 200 pF
RL = ∞ ; CL = 500 pF
VREFH
6
8
12
1
V
µs
µs
V/µs
dc crosstalk (channel-to-channel)
0.0025
LSB
ac crosstalk (channel-to-channel)
1 kHz Sine Wave
-100
dB
Capacitive load stability
Digital-to-analog glitch impulse
RL= ∞
RL= 2 kΩ
1 LSB change around major
carry
470
1000
12
pF
pF
nV-s
Digital feedthrough
0.3
nV-s
dc output impedance
1
Ω
Short-circuit current
Power-up time
REFERENCE INPUT
VDD= 5 V
50
mA
VDD= 3 V
20
mA
Coming out of power-down
2.5
µs
mode, VDD= +5 V
Coming out of power-down
5
µs
mode, VDD= +3 V
VREFH Input range
VREFL Input range
Reference input impedance
VREFL<VREFH
0
VDD
V
0
GND
VDD/2
V
25
kΩ
Reference current
LOGIC INPUTS (3)
VREF=VDD = +5 V
VREF=VDD = +3 V
185
260
µA
122
200
Input current
±1
µA
VIN_L, Input low voltage
VIN_H, Input high voltage
Pin Capacitance
0.7xIOVDD
0.3xIOVDD
V
V
3
pF
POWER REQUIREMENTS
VDD, IOVDD
2.7
5.5
V
IDD(normal operation), including reference current
Excluding load current
IDD@ VDD=+3.6V to +5.5V
VIH= IOVDD and VIL=GND
600
900
µA
IDD@ VDD =+2.7V to +3.6V
VIH= IOVDD and VIL=GND
500
750
µA
IDD (all power-down modes)
(1) Linearity tested using a reduced code range of 3 to 253; output unloaded.
(2) VREFH = VDD - 0.1, VREFL = GND
(3) Specified by design and characterization, not production tested.
3