CY5474FCT543T Datasheet, PDF (3/9 Pages) Texas Instruments – 8-Bit Latched Registered Transceiver

CY54/74FCT543T
Electrical Characteristics Over the Operating Range
Parameter
Description
V_OH
Output HIGH Voltage
V_OL
V_IH
V_IL
V_H
V_IK
I_IH
I_IH
I_IL
I_OZH
I_OZL
I_OS
I_OFF
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Hysteresis^[8]
Input Clamp Diode Voltage
Input HIGH Current
Input HIGH Current^[8]
Input LOW Current^[8]
Off State HIGH-Level Output
Current
Off State LOW-Level
Output Current
Output Short Circuit Current^[9]
Power-Off Disable
Test Conditions
V_CC=Min., I_OH=–32 mA
V_CC=Min., I_OH=–15 mA
V_CC=Min., I_OH=–12 mA
V_CC=Min., I_OL=64 mA
V_CC=Min., I_OL=48mA
Com’l
Com’l
Mil
Com’l
Mil
All inputs
V_CC=Min., I_IN=–18 mA
V_CC=Max., V_IN=V_CC
V_CC=Max., V_IN=2.7V
V_CC=Max., V_IN=0.5V
V_CC=Max., V_OUT = 2.7V
V_CC= Max., V_OUT = 0.5V
V_CC=Max., V_OUT=0.0V
V_CC=0V, V_OUT=4.5V
Min. Typ.^[7] Max. Unit
2.0
V
2.4
3.3
V
2.4
3.3
V
0.3 0.55
V
0.3 0.55
V
2.0
V
0.8
V
0.2
V
–0.7 –1.2
V
5
µA
±1
µA
±1
µA
10
µA
–10 µA
–60 –120 –225 mA
±1
µA
Capacitance^[8]
Parameter
Description
Typ.^[7]
Max.
Unit
C_IN
Input Capacitance
5
10
pF
C_OUT
Output Capacitance
9
12
pF
Notes:
7. Typical values are at V_CC=5.0V, T_A=+25˚C ambient.
8. This parameter is specified but not tested.
9. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I_OS tests should be performed last.
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