MSP430X11X2_11 Datasheet, PDF (25/52 Pages) Texas Instruments – MIXED SIGNAL MICROCONTROLLER

MSP430x11x2, MSP430x12x2
MIXED SIGNAL MICROCONTROLLER
SLAS361D − JANUARY 2002 − REVISED AUGUST 2004
electrical characteristics over recommended operating free-air temperature (unless otherwise
noted) (continued)
10-bit ADC, power supply and input range conditions (see Note 1)
PARAMETER
TEST CONDITIONS
MIN NOM MAX UNIT
V_CC
V_(P6.x/Ax)
I_ADC10
Analog supply voltage
Analog input voltage
range (see Note 2)
Operating supply current
into V_CC terminal
(see Note 3)
V_SS = 0 V
All Ax terminals. Analog inputs
selected in ADC10AE register and PxSel.x=1
V_SS ≤ V_Px.x/Ax ≤ V_CC
f_ADC10CLK = 5.0 MHz
ADC10ON = 1, REFON = 0
ADC10SHT0=1, ADC10SHT1=0,
ADC10DIV=0
V_CC = 2.2 V
V_CC = 3 V
2.2
3.6 V
0
V_CC
V
0.52 1.05
mA
0.6
1.2
I_REF+
Reference operating
supply current,
reference buffer disabled
(see Note 4)
f_ADC10CLK = 5.0 MHz
ADC10ON = 0,
REFON = 1, REF2_5V = x;
REFOUT = 0
V_CC =
2.2V/3 V
0.25
0.4 mA
I_REFB
Reference buffer
operating supply current
(see Note 4)
f_ADC10CLK = 5.0 MHz
ADC10ON = 0,
REFON = 1, REF2_5V = 0
REFOUT = 1
ADC10SR = 0
ADC10SR = 1
1.1
1.4
mA
0.46 0.55
C_I ^†
Input capacitance
Only one terminal can be selected
at one time, Px.x/Ax
V_CC = 2.2 V
27 pF
R_I^†
Input MUX ON resistance 0V ≤ V_Ax ≤ V_CC
V_CC = 3 V
2000 Ω
† _{Not production tested, limits verified by design}
NOTES: 1. The leakage current is defined in the leakage current table with Px.x/Ax parameter.
2. The analog input voltage range must be within the selected reference voltage range V_R+ to V_R− for valid conversion results.
3. The internal reference supply current is not included in current consumption parameter I_ADC10.
4. The internal reference current is supplied via terminal V_CC. Consumption is independent of the ADC10ON control bit, unless a
conversion is active. The REFON bit enables the built-in reference to settle before starting an A/D conversion.
10-bit ADC, external reference (see Note 1)
V_eREF+
PARAMETER
Positive external
reference voltage input
TEST CONDITIONS
V_eREF+ > V_REF−/V_eREF− (see Note 2)
V_CC
MIN NOM MAX UNIT
1.4
V_CC
V
V_{REF− /}V_eREF−
Negative external
reference voltage input ^{VeREF+ > VREF−/VeREF− (see Note 3)}
0
1.2 V
(V_eREF+ −
V_REF−/V_eREF−)
Differential external
reference voltage input
V_eREF+ > V_REF−/V_eREF− (see Note 4)
1.4
V_CC
V
I_VeREF+
Static input current
0V ≤V_eREF+ ≤ V_CC
2.2 V/3 V
±1 µA
I_{VREF−/VeREF−}
Static input current
0V ≤ V_eREF− ≤ V_CC
2.2 V/3 V
±1 µA
NOTES:
1. The external reference is used during conversion to charge and discharge the capacitance array. The input capacitance, C_I, is also
the dynamic load for an external reference during conversion. The dynamic impedance of the reference supply should follow the
recommendations on analog-source impedance to allow the charge to settle for 10-bit accuracy.
2. The accuracy limits the minimum positive external reference voltage. Lower reference voltage levels may be applied with reduced
accuracy requirements.
3. The accuracy limits the maximum negative external reference voltage. Higher reference voltage levels may be applied with reduced
accuracy requirements.
4. The accuracy limits minimum external differential reference voltage. Lower differential reference voltage levels may be applied with
reduced accuracy requirements.
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