OPA333_15 Datasheet, PDF (2/33 Pages) Texas Instruments – 1.8-V, microPower, CMOS Operational Amplifiers, Zero-Drift Series

OPA333
OPA2333
SBOS351D – MARCH 2006 – REVISED NOVEMBER 2013
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION⁽¹⁾
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Voltage
Curent
Supply
Signal input terminals⁽²⁾
Signal input terminals⁽²⁾
Output short-circuit⁽³⁾
Temperature
Operating, T_A
Storage, T_stg
Junction, T_J
Human body model (HBM)
Electrostatic discharge (ESD) ratings Charged device model (CDM)
Machine model (MM)
VALUE
+7
–0.3 to (V+) + 0.3
±10
Continuous
–40 to +150
–65 to +150
+150
4000
1000
400
UNIT
V
V
mA
mA
°C
°C
°C
V
V
V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.3 V beyond the supply rails should
be current limited to 10 mA or less.
(3) Short-circuit to ground, one amplifier per package.
2
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