DRV401-EP Datasheet, PDF (2/33 Pages) Texas Instruments – SENSOR SIGNAL CONDITIONING IC FOR CLOSED-LOOP MAGNETIC CURRENT SENSOR

DRV401-EP
SBVS104 – JANUARY 2008............................................................................................................................................................................................... www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PRODUCT
DRV401
ORDERING INFORMATION⁽¹⁾
PACKAGE-LEAD
PACKAGE DESIGNATOR⁽²⁾
SO-20
DWP
PACKAGE MARKING
DRV401M
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
Patents Pending.
Compensation
R_S
PWM PWM
I_COMP1
I_COMP2
Compensation Winding
Primary Winding
Magnetic Core
Field Probe
I_P
DRV401
IS2
IS1
Probe
Interface
Integrator
Filter
H−Bridge
Driver
Diff
Amp
V_OUT
REF_IN
Timing, Error Detection,
and Power Control
Degauss
V_REF
V_REF
+5V GND
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
over operating free-air temperature range (unless otherwise noted)
Supply voltage
Voltage ⁽²⁾
Signal Input
terminals:
Differential amplifier⁽³⁾
Current at IS1 and IS2
Current (pins other than IS1 and IS2)⁽²⁾
I_COMP short circuit⁽⁴⁾
Operating junction temperature
Storage temperature
ESD rating
Human body model
(HBM)
Pins IA_IN1 and IA_IN2 only
All other pins
MIN
MAX
+7
–0.5 V_DD + 0.5
–10
+10
±75
±25
+250
–55
+150
–55
+150
1
4
UNIT
V
V
V
mA
mA
mA
°C
°C
kV
kV
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails must
be current limited, except for the differential amplifier input pins.
(3) These inputs are not internally protected against over voltage. The differential amplifier input pins must be limited to 5 mA, max or
±10 V, max.
(4) Power-limited; observe maximum junction temperature.
2
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