BUF22821 Datasheet, PDF (2/25 Pages) Texas Instruments – Programmable Gamma-Voltage Generator and VCOM Calibrator with Integrated Two-Bank Memory

BUF22821
SBOS399 – JUNE 2007
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
PACKAGE/ORDERING INFORMATION⁽¹⁾
PRODUCT
BUF22821
PACKAGE
HTSSOP-38
PACKAGE DESIGNATOR
DCP
PACKAGE MARKING
BUF22821
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range (unless otherwise noted).
Supply Voltage, V_S
Supply Voltage, V_SD
Digital Input Terminals, SCL, SDA, AO, BKSEL: Voltage
Digital Input Terminals, SCL, SDA, AO, BKSEL: Current
Analog Input Terminals, STATINL, STATINH: Voltage
Analog Input Terminals, STATINL, STATINH: Current
Output Short-Circuit⁽²⁾
Operating Temperature
Storage Temperature
Junction Temperature
Human Body Model
ESD Ratings Charged-Device Model
Machine Model
BUF22821
+22
+6
–0.5 to +6
±10
–0.5 to V_S + 0.5
±10
Continuous
–40 to +95
–65 to +150
+125
4000
1000
200
UNIT
V
V
V
mA
V
mA
°C
°C
°C
V
V
V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2) Short-circuit to ground, one channel at a time.
2
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