ASD1194 Datasheet, PDF (2/76 Pages) Texas Instruments – Low-Power, 8-Channel, 16-Bit Analog Front-End for Biopotential Measurements

ADS1194, ADS1196
ADS1198
SBAS471C – APRIL 2010 – REVISED NOVEMBER 2011
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PRODUCT
ADS1194
ADS1196
ADS1198
ADS1294
ADS1294R
ADS1294
ADS1296
ADS1296R
ADS1296
ADS1298
ADS1298R
ADS1298
PACKAGE
OPTION
BGA
TQFP
BGA
TQFP
BGA
TQFP
BGA
BGA
TQFP
BGA
BGA
TQFP
BGA
BGA
TQFP
FAMILY AND ORDERING INFORMATION⁽¹⁾
NUMBER OF
CHANNELS
ADC
RESOLUTION
MAXIMUM
SAMPLE RATE
(kSPS)
4
16
8
4
16
8
6
16
8
6
16
8
8
16
8
8
16
8
4
24
32
4
24
32
4
24
32
6
24
32
6
24
32
6
24
32
8
24
32
8
24
32
8
24
32
OPERATING
TEMPERATURE
RANGE
0°C to +70°C
0°C to +70°C
0°C to +70°C
0°C to +70°C
0°C to +70°C
0°C to +70°C
0°C to +70°C
–40°C to +85°C
–40°C to +85°C
0°C to +70°C
–40°C to +85°C
–40°C to +85°C
0°C to +70°C
–40°C to +85°C
–40°C to +85°C
RESPIRATION
CIRCUITRY
No
No
No
No
No
No
External
Yes
External
External
Yes
External
External
Yes
External
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range, unless otherwise noted.
AVDD to AVSS
DVDD to DGND
AVSS to DGND
V_REF input to AVSS
Analog input to AVSS
Digital input voltage to DGND
Digital output voltage to DGND
Input current (momentary)
Input current (continuous)
Operating
temperature
range
ADS1194, ADS1196, ADS1198
ESD ratings
Human body model (HBM)
JEDEC standard 22, test method A114-C.01, all pins
Charged device model (CDM)
JEDEC standard 22, test method C101, all pins
Storage temperature range
Maximum junction temperature (T_J)
ADS1194, ADS1196, ADS1198
–0.3 to +5.5
–0.3 to +3.9
–3 to +0.2
AVSS – 0.3 to AVDD + 0.3
AVSS – 0.3 to AVDD + 0.3
–0.3 to DVDD + 0.3
–0.3 to DVDD + 0.3
100
10
0 to +70
±2000
±500
–60 to +150
+150
UNIT
V
V
V
V
V
V
V
mA
mA
°C
V
V
°C
°C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2
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