TLE2082 Datasheet, PDF (19/37 Pages) Texas Instruments – EXCALIBUR HIGH-SPEED JFET-INPUT DUAL OPERATIONAL AMPLIFIERS

TLE2082, TLE2082A, TLE2082Y
EXCALIBUR HIGH-SPEED
JFET-INPUT DUAL OPERATIONAL AMPLIFIERS
SLOS105A – AUGUST 1991 – REVISED AUGUST 1994
PARAMETER MEASUREMENT INFORMATION
2 kΩ
VCC ₊
–
+
VO
RS
RS
VCC _–
Ground Shield
VCC ₊
–
+
VO
VCC _–
Picoammeters
Figure 3. Noise-Voltage Test Circuit
Figure 4. Input-Bias and Offset-
Current Test Circuit
VCC ₊
IN –
–
IN +
Cid
+
VO
Cic
Cic
VCC _–
Figure 5. Internal Input Capacitance
typical values
Typical values presented in this data sheet represent the median (50% point) of device parametric performance.
input bias and offset current
At the picoampere bias-current level typical of the TLE2082 and TLE2082A, accurate measurement of the bias
becomes difficult. Not only does this measurement require a picoammeter, but test socket leakages can easily
exceed the actual device bias currents. To accurately measure these small currents, Texas Instruments uses
a two-step process. The socket leakage is measured using picoammeters with bias voltages applied but with
no device in the socket. The device is then inserted in the socket, and a second test is performed that measures
both the socket leakage and the device input bias current. The two measurements are then subtracted
algebraically to determine the bias current of the device.
TYPICAL CHARACTERISTICS
Table of Graphs
VIO
α_VIO
IIO
IIB
VICR
VID
Input offset voltage
Temperature coefficient
Input offset current
Input bias current
Common-mode input voltage range
Differential input voltage
Distribution
Distribution
vs Free-air temperature
vs Free-air temperature
vs Total supply voltage
vs Free-air temperature
vs Output voltage
FIGURE
6
7
8, 9
8, 9
10
11
12, 13
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