CC2640_15 Datasheet, PDF (18/51 Pages) Texas Instruments – CC2640 SimpleLink Bluetooth Smart Wireless MCU

CC2640
SWRS176 – FEBRUARY 2015
www.ti.com
5.10 24-MHz Crystal Oscillator (XOSC_HF)⁽¹⁾
Measured on Texas Instruments CC2650EM-5XD reference design with T_c=25°C, V_DDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
Crystal frequency
Crystal frequency tolerance⁽²⁾
24
MHz
-40
40
ppm
ESR Equivalent series resistance
20
60
Ω
CL Crystal load capacitance
Start-up time⁽³⁾
5
150
9
pF
µs
(1) Probing or otherwise stopping the XTAL while the DC-DC converter is enabled may cause permanent damage to the device.
(2) Includes initial tolerance of the crystal, drift over temperature, aging and frequency pulling due to incorrect load capacitance. As per
Bluetooth specification
(3) Kick-started based on a temperature and aging compensated RCOSC_HF using precharge injection
5.11 32.768-kHz Crystal Oscillator (XOSC_LF)
Measured on Texas Instruments CC2650EM-5XD reference design with T_c=25°C, V_DDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
Crystal frequency
32.768
kHz
Crystal frequency tolerance, Bluetooth low
energy applications
-250
250 ppm
ESR Equivalent series resistance
30
100
kΩ
CL Crystal load capacitance
6
12
pF
5.12 48-MHz RC Oscillator (RCOSC_HF)
Measured on Texas Instruments CC2650EM-5XD reference design with T_c=25°C, V_DDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
Frequency
48
MHz
Uncalibrated frequency accuracy
Calibrated frequency accuracy⁽¹⁾
±1%
±0.25%
Start-up time
5
µs
(1) Accuracy relatively to the calibration source (XOSC_HF).
5.13 32-kHz RC Oscillator (RCOSC_LF)
Measured on Texas Instruments CC2650EM-5XD reference design with T_c=25°C, V_DDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
Calibrated frequency
32.8
kHz
Temperature coefficient
50
ppm/°C
18
Specifications
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