TMS28F210 Datasheet, PDF (1/25 Pages) Texas Instruments – 65536 BY 16-BIT FLASH MEMORY

D Organization . . . 65 536 by 16-Bits
D Pin Compatible With Existing 1-Megabit
EPROMs
D All Inputs/Outputs TTL Compatible
D V_CC Tolerance ±10%
D Maximum Access/Minimum Cycle Time
’28F210-10 100 ns
’28F210-12 120 ns
’28F210-15 150 ns
’28F210-17 170 ns
D Industry-Standard Programming Algorithm
D PEP4 Version Available With 168-Hour
Burn-In and Choice of Operating
Temperature Ranges
D 10000 and 1 000 Program/Erase Cycles
D Latchup Immunity of 250 mA on All Input
and Output Lines
D Low Power Dissipation ( V_CC = 5.5 V )
– Active Write . . . 55 mW
– Active Read . . . 165 mW
– Electrical Erase . . . 82.5 mW
– Standby . . . 0.55 mW
(CMOS-Input Levels)
D Automotive Temperature Range
– 40°C to 125°C
TMS28F210
65536 BY 16-BIT
FLASH MEMORY
SMJS210D – DECEMBER 1992 – REVISED AUGUST 1997
FN PACKAGE
( TOP VIEW )
DQ12
DQ11
DQ10
DQ9
DQ8
VSS
NC
DQ7
DQ6
DQ5
DQ4
6543
7
8
9
10
11
12
13
14
15
16
17
2 1 44 43 42 41 40
39
38
37
36
35
34
33
32
31
30
29
18 19 20 21 22 23 24 25 26 27 28
A13
A12
A11
A10
A9
VSS
NC
A8
A7
A6
A5
description
The TMS28F210 is a 65 536 by 16-bit (1048 576-bit), programmable read-only memory that can be electrically
bulk-erased and reprogrammed. It is available in 10 000- and 1 000-program/erase-endurance-cycle versions.
The TMS28F210 flash memory is offered in a 44-lead plastic leaded chip carrier package using 1,25 mm
(50-mil) lead spacing (FN suffix), and a 40-lead thin small-outline package (DBW suffix).
The TMS28F210 is characterized for operation in temperature ranges of 0°C to 70°C, – 40°C to 85°C, and
– 40°C to 125°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1997, Texas Instruments Incorporated
• POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
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