THS4303 Datasheet, PDF (1/24 Pages) Texas Instruments – WIDEBAND FIXED-GAIN AMPLIFIER

THS4303
www.ti.com
SLOS421B – NOVEMBER 2003 – REVISED JANUARY 2005
WIDEBAND FIXED-GAIN AMPLIFIER
FEATURES
• Fixed Closed-Loop Gain Amplifier
– 10 V/V (20 dB)
• Wide Bandwidth: 1.8 GHz
• High Slew Rate: 5500 V/µs
• Low Total Input Referred Noise: 2.5 nV/√Hz
• Low Distortion
– HD₂: –65 dBc at 70 MHz
– HD₃: –76 dBc at 70 MHz
– IMD₃: –85 dBc at 100 MHz
– OIP₃: 34 dBm at 100 MHz
– IMD₃: –70 dBc at 300 MHz
– OIP₃: 27 dBm at 300 MHz
• High Output Drive: ±180 mA
• Power Supply Voltage: 3 V or 5 V
V_S+
APPLICATIONS
• Wideband Signal Processing
• Wireless Transceivers
• IF Amplifier
• ADC Preamplifier
• DAC Output Buffers
• Test, Measurement, and Instrumentation
• Medical and Industrial Imaging
DESCRIPTION
The THS4303 device is a wideband, fixed-gain ampli-
fier that offers high bandwidth, high slew rate, low
noise, and low distortion. This combination of specifi-
cations enables analog designers to transcend cur-
rent performance limitations and process analog sig-
nals at much higher speeds than previously possible
with closed-loop, complementary amplifier designs.
The devices are offered in a 16-pin leadless package
and incorporate a power-down mode for quiescent
power savings.
+
FB
22 µF
50 Ω Source
V_I
49.9 Ω
R_g
V_S−
R_f
_
+ _THS4303
47 pF
0.1 µF
30.1 Ω
50 Ω Load
49.9 Ω ^VO
+ 22 µF ^FB
FB = Ferrite Bead
47 pF
0.1 µF
30.1 Ω
SMALL SIGNAL FREQUENCY RESPONSE
22
20
18
16
14
R_L = 100 Ω
12 ^VO ^{= 100 mV}PP
V_S = 5 V
10
100 k 1 M
10 M 100 M 1 G
f − Frequency − Hz
10 G
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2003–2005, Texas Instruments Incorporated