SN74CBTS6800 Datasheet, PDF (1/4 Pages) Texas Instruments – 10-BIT FET BUS SWITCH WITH PRECHARGED OUTPUTS AND SCHOTTKY DIODE CLAMPING

SN74CBTS6800
10-BIT FET BUS SWITCH
WITH PRECHARGED OUTPUTS AND SCHOTTKY DIODE CLAMPING
SCDS102A – JUNE 1999 – REVISED JULY 1999
D 5-Ω Switch Connection Between Two Ports
D TTL-Compatible Input Levels
D Outputs Are Precharged by Bias Voltage to
Minimize Signal Distortion During Live
Insertion
D Schottky Diodes on the I/Os to Clamp
Undershoots up to –2 V
D Package Options Include Plastic Shrink
Small-Outline (DB, DBQ), Thin Very
Small-Outline (DGV), Small-Outline (DW),
and Thin Shrink Small-Outline (PW)
Packages
description
DB, DBQ, DGV, DW, OR PW PACKAGE
(TOP VIEW)
ON 1
A1 2
A2 3
A3 4
A4 5
A5 6
A6 7
A7 8
A8 9
A9 10
A10 11
GND 12
24 V_CC
23 B1
22 B2
21 B3
20 B4
19 B5
18 B6
17 B7
16 B8
15 B9
14 B10
13 BIASV
The SN74CBTS6800 provides ten bits of
high-speed TTL-compatible bus switching with
Schottky diodes on the I/Os to clamp undershoot.
The low on-state resistance of the switch allows bidirectional connections to be made, while adding near-zero
propagation delay. The device also precharges the B port to a user-selectable bias voltage (BIASV) to minimize
live-insertion noise.
The SN74CBTS6800 is organized as one 10-bit switch with a single enable (ON) input. When ON is low, the
switch is on, and port A is connected to port B. When ON is high, the switch between port A and port B is open.
When ON is high or V_CC is 0 V, B port is precharged to BIASV through the equivalent of a 10-kΩ resistor.
The SN74CBTS6800 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
ON B1–B10 FUNCTION
L A1–A10
Connect
H
BIASV
Precharge
logic diagram (positive logic)
13
BIASV
2
A1
23
B1
11
A10
14
B10
1
ON
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 1999, Texas Instruments Incorporated
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