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SN74CBT3125_10 Datasheet, PDF (1/20 Pages) Texas Instruments – QUADRUPLE FET BUS SWITCH
SN74CBT3125
QUADRUPLE FET BUS SWITCH
D Standard ’125-Type Pinout (D, DB, DGV,
and PW Packages)
SCDS021I − MAY 1995 − REVISED SEPTEMBER 2002
D 5-Ω Switch Connection Between Two Ports
D TTL-Compatible Input Levels
D, DB, DGV, OR PW PACKAGE
(TOP VIEW)
1OE 1
1A 2
1B 3
2OE 4
2A 5
2B 6
GND 7
14 VCC
13 4OE
12 4A
11 4B
10 3OE
9 3A
8 3B
RGY PACKAGE
(TOP VIEW)
1
1A 2
1B 3
2OE 4
2A 5
2B 6
7
14
13 4OE
12 4A
11 4B
10 3OE
9 3A
8
DBQ PACKAGE
(TOP VIEW)
NC 1
1OE 2
1A 3
1B 4
2OE 5
2A 6
2B 7
GND 8
16 VCC
15 4OE
14 4A
13 4B
12 3OE
11 3A
10 3B
9 NC
NC − No internal connection
description/ordering information
The SN74CBT3125 quadruple FET bus switch features independent line switches. Each switch is disabled
when the associated output-enable (OE) input is high.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
QFN − RGY
Tape and reel SN74CBT3125RGYR CU125
SOIC − D
Tube
Tape and reel
SN74CBT3125D
SN74CBT3125DR
CBT3125
−40°C to 85°C SSOP − DB
Tape and reel
SSOP (QSOP) − DBQ Tape and reel
SN74CBT3125DBR CU125
SN74CBT3125DBQR CU125
TSSOP − PW
Tape and reel SN74CBT3125PWR CU125
TVSOP − DGV
Tape and reel SN74CBT3125DGVR CU125
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design
guidelines are available at www.ti.com/sc/package.
FUNCTION TABLE
(each bus switch)
INPUT
OE
FUNCTION
L
A port = B port
H
Disconnect
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright © 2002, Texas Instruments Incorporated
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