SN54ABT8952_07 Datasheet, PDF (1/29 Pages) Texas Instruments – SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D Functionally Equivalent to ’BCT2952 and
’ABT2952 in the Normal-Function Mode
D SCOPE ™ Instruction Set
D IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP, and
HIGHZ
D Parallel-Signature Analysis at Inputs With
Masking Option
D Pseudo-Random Pattern Generation From
Outputs
D Sample Inputs/Toggle Outputs
D Binary Count From Outputs
D Even-Parity Opcodes
D Two Boundary-Scan Cells Per I/O for
Greater Flexibility
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Package Options Include Shrink
Small-Outline (DL) and Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Ceramic
DIPs (JT)
description
The ’ABT8952 scan test devices with octal
registered bus transceivers are members of the
Texas Instruments SCOPE ™ testability integra-
ted-circuit family. This family of devices supports
IEEE Standard 1149.1-1990 boundary scan to
facilitate testing of complex circuit-board assem-
blies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
SN54ABT8952 . . . JT PACKAGE
SN74ABT8952 . . . DL OR DW PACKAGE
(TOP VIEW)
CLKAB 1
CLKENAB 2
OEAB 3
A1 4
A2 5
A3 6
GND 7
A4 8
A5 9
A6 10
A7 11
A8 12
TDO 13
TMS 14
28 CLKBA
27 CLKENBA
26 OEBA
25 B1
24 B2
23 B3
22 B4
21 V_CC
20 B5
19 B6
18 B7
17 B8
16 TDI
15 TCK
SN54ABT8952 . . . FK PACKAGE
(TOP VIEW)
OEBA
CLKENBA
CLKBA
CLKAB
CLKENAB
OEAB
A1
4 3 2 1 28 27 26
5
25
6
24
7
23
8
22
9
21
10
20
11
19
12 13 14 15 16 17 18
B7
B8
TDI
TCK
TMS
TDO
A8
In the normal mode, these devices are functionally equivalent to the ’BCT2952 and ’ABT2952 octal registered
bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE™ octal registered bus transceivers.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
Copyright © 1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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