SN54ABT8245 Datasheet, PDF (1/25 Pages) Texas Instruments – SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

SN54ABT8245, SN74ABT8245
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
D Functionally Equivalent to ’F245 and
’ABT245 in the Normal-Function Mode
D SCOPE ™ Instruction Set:
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes
D Two Boundary-Scan Cells per I/O for
Greater Flexibility
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Package Options Include Plastic
Small-Outline Packages (DW), Ceramic
Chip Carriers(FK), and Standard Ceramic
DIPs (JT)
description
The ’ABT8245 scan test devices with octal bus
transceivers are members of the Texas Instru-
ments SCOPE ™ testability integrated-circuit
family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
SN54ABT8245 . . . JT PACKAGE
SN74ABT8245 . . . DW PACKAGE
(TOP VIEW)
DIR 1
B1 2
B2 3
B3 4
B4 5
GND 6
B5 7
B6 8
B7 9
B8 10
TDO 11
TMS 12
24 OE
23 A1
22 A2
21 A3
20 A4
19 A5
18 V_CC
17 A6
16 A7
15 A8
14 TDI
13 TCK
SN54ABT8245 . . . FK PACKAGE
(TOP VIEW)
4 3 2 1 28 27 26
A2 ⁵
25 A8
A1 ⁶
24 TDI
OE ⁷
23 TCK
NC ⁸
22 _NC
DIR ⁹
21 _TMS
B1 ¹⁰
20 _TDO
B2 ¹¹
19 _B8
12 13 14 15 16 17 18
NC – No internal connection
In the normal mode, these devices are functionally equivalent to the ’F245 and ’ABT245 octal bus transceivers.
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins
or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the
functional operation of the SCOPE ™ octal bus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The
output-enable (OE) input can be used to disable the device so that the buses are effectively isolated.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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