RI-I11-110A-01 Datasheet, PDF (1/4 Pages) Texas Instruments – Tag-it™ HF TRANSPONDER INLAYS SQUARE RECTANGLE

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RI-I11-110A-01
SCBS868 – FEBRUARY 2005 – REVISED DECEMBER 2006
Tag-it™ HF TRANSPONDER INLAYS SQUARE RECTANGLE
FEATURES
• 13.56 MHz Operating Frequency
• 256 Bit User Memory in 8 × 32-bit Blocks
• User and Factory Lock per Block
• Simultaneous Identification (Anti-collision)
APPLICATIONS
• Library Applications
• Product Authentication
• Ticketing
• Stored Value
DESCRIPTION
Texas Instruments’ Tag-it™ HF Transponder Inlays are the first generation of ‘smart’ inlays consist of 13.56
MHz high frequency (HF) transponders. These products offer a user accessible memory of 256 bits, organized
in 8 blocks available in three different antenna shapes with frequency offset for integration into paper, PVC or
other substrates.
Tag-it HF Transponder Inlays are manufactured with TI’s patented laser tuning process to provide consistent
read performance. And prior to delivery, the transponders undergo complete functional and parametric testing in
order to provide the high quality that customers have come to expect from TI.
The Tag-it HF Transponder Inlays are well suited for a variety of applications including but not limited to: product
authentication, library applications, supply chain management, asset management, and ticketing/stored value
applications.
Typical quantity of good units per reel
ORDERING INFORMATION
PACKAGE ⁽¹⁾
5,000
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Tag-it is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2006, Texas Instruments Incorporated