OPA1662-Q1 Datasheet, PDF (1/30 Pages) Texas Instruments – Low-Power, Low Noise and Distortion, Bipolar-Input AUDIO OPERATIONAL AMPLIFIERS

OPA1662-Q1
www.ti.com
SLOS805B – JULY 2012 – REVISED OCTOBER 2012
Low-Power, Low Noise and Distortion, Bipolar-Input AUDIO OPERATIONAL AMPLIFIERS
Check for Samples: OPA1662-Q1
FEATURES
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• Qualified for Automotive Applications
• AEC-Q100 Qualified With the Following
Results
– Device Temperature Grade 3: –40°C to 85°C
Ambient Operating Temperature Range
– Device HBM ESD Classification Level H2
– Device CDM ESD Classification Level C3B
• Low Noise: 3.3 nV/√Hz at 1 kHz
• Low Distortion: 0.00006% at 1 kHz
• Low Quiescent Current:
1.5 mA per Channel
• Slew Rate: 17 V/μs
• Wide Gain Bandwidth: 22 MHz (G = +1)
• Unity Gain Stable
• Rail-to-Rail Output
• Wide Supply Range:
±1.5 V to ±18 V, or 3 V to 36 V
• Small Package Sizes:
Dual: SO-8 and MSOP-8
DESCRIPTION
The OPA1662-Q1 (dual) bipolar-input operational
amplifier achieves a low 3.3 nV/√Hz noise density
with an ultralow distortion of 0.00006% at 1 kHz. The
OPA1662-Q1 op amp offers rail-to-rail output swing to
within 600 mV with 2-kΩ load, which increases
headroom and maximizes dynamic range. This
device also has a high output drive capability of ±30
mA.
The device operates over a very wide supply range of
±1.5 V to ±18 V, or 3 V to 36 V, on only 1.5 mA of
supply current per channel. The OPA1662-Q1 op
amp is unity-gain stable and provides excellent
dynamic behavior over a wide range of load
conditions.
The device also features completely independent
circuitry for lowest crosstalk and freedom from
interactions between channels, even when overdriven
or overloaded.
The OPA1662-Q1 is specified from –40°C to 85°C.
APPLICATIONS
• Automotive
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated