CD74HCT4543 Datasheet, PDF (1/10 Pages) Texas Instruments – BCD-TO-7 SEGMENT LATCH/DECODER/DRIVER

CD74HCT4543
BCD-TO-7 SEGMENT LATCH/DECODER/DRIVER
D 4.5-V to 5.5-V V_CC Operation
D Input Latches for BCD Code Storage
D Blanking Capability
D Phase Input for Complementing Outputs
D Fanout (Over Temperature Range)
– Standard Outputs – 10 LSTTL Loads
D Balanced Propagation Delay and Transition
Times
D Significant Power Reduction, Compared to
LSTTL Logic ICs
D Direct LSTTL Input Logic Compatibility,
V_IL = 0.8 V Maximum, V_IH = 2 V Minimum
D CMOS Input Compatibility, I_I ≤ 1 µA at V_OL,
V_OH
SCHS281A – REVISED MAY 2003
E PACKAGE
(TOP VIEW)
LD 1
D2 2
BCD
Inputs
D1 3
D3 ⁴
D0 ⁵
PH ⁶
BI ⁷
GND ⁸
16 V_CC
15 f
14 g
13 e
12 d
11 c
7-Segment
Outputs
10 b
9a
DISPLAY
0 1 23 4 567 8 9
a
fg b
e
c
d
description/ordering information
The CD74HCT4543 high-speed silicon-gate is a BCD-to-7 segment latch/decoder/driver designed primarily for
directly driving liquid-crystal displays. While the latch enable (LD) is low, the latches are enabled to store the
BCD inputs. When the latch enable is high, the latches are disabled, making the outputs transparent to the BCD
inputs. The device has an active-high blanking input (BI) and a phase input (PH) to which a square wave is
applied for liquid-crystal applications. This square wave also is applied to the backplane of the liquid-crystal
display.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
–55°C to 125°C PDIP – E Tube
CD74HCT4543E CD74HCT4543E
† _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB}
design guidelines are available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2003, Texas Instruments Incorporated
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